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B. Chin

1990 – 1999

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1996
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James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O'Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, H. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus: IBM experiments in soft fails in computer electronics (1978-1994). IBM Journal of Research and Development 40(1): 3-18 (1996)