Bernard Courtois

Marco Casale-Rossi, Alberto L. Sangiovanni-Vincentelli, Luca P. Carloni, Bernard Courtois, Hugo De Man, Antun Domic, Jan M. Rabaey: Panel: the heritage of Mead & Conway: what has remained the same, what was missed, what has changed, what lies ahead. DATE 2013: 171-175

Bernard Courtois: Special section NANOTECH 2011. Microelectronics Journal 43(5): 299 (2012)

Bernard Courtois: European Nano Systems 2007. Microelectronics Journal 40(4-5): 655 (2009)

Bernard Courtois, Kholdoun Torki, S. Dumont, S. Eyraud, J.-F. Paillotin, Gregory di Pendina: Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India. VLSI Design 2009: 561-566

Bernard Courtois, Chandu Visweswariah: Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations. VTS 2009: 237

Bernard Courtois, Ali Shakouri: Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips. VTS 2009: 241

Bernard Courtois: European Nano Systems 2006. Microelectronics Journal 39(8): 1031 (2008)

Peter Szabó, Balázs Németh, Márta Rencz, Bernard Courtois: Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology. CoRR abs/0711.3301 (2007)

Bernard Courtois: Session Abstract. VTS 2006: 150-151

Bernard Courtois: Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004. Microelectronics Journal 36(7): 613 (2005)

Bernard Courtois: Infrastructures for Education, Research and Industry in Microelectronics - A review. DELTA 2004: 149-156

Salvador Mir, Benoît Charlot, Libor Rufer, Bernard Courtois: On-chip testing of embedded silicon transducers. SoCC 2004: 13-18

Salvador Mir, Libor Rufer, Bernard Courtois: On-chip testing of embedded transducers. VLSI Design 2004: 463-

Bernard Courtois: Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen. it - Information Technology 45(6): 318-326 (2003)

Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electronic Testing 17(6): 459-470 (2001)

Kholdoun Torki, Bernard Courtois: CMP: The Access to Advanced Low Costy Manufacturing. MSE 2001: 6-

Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217

Salvador Mir, Benoît Charlot, Bernard Courtois: Extending Fault-Based Testing to Microelectromechanical Systems. J. Electronic Testing 16(3): 279-288 (2000)

Márta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois: IDDQ Testing of Submicron CMOS - by Cooling? J. Electronic Testing 16(5): 453-461 (2000)

Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois: Design of self-checking fully differential circuits and boards. IEEE Trans. VLSI Syst. 8(2): 113-128 (2000)

Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz: Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33

Bernard Courtois, R. D. (Shawn) Blanton: Guest Editors' Introduction. IEEE Design & Test of Computers 16(4): 16-17 (1999)

Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328

Kholdoun Torki, Bernard Courtois: Advanced Low Cost Manufacturing From CMP Service. MSE 1999: 4-5

Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-

Vladimir Székely, Márta Rencz, Bernard Courtois: Tracing the Thermal Behavior of ICs. IEEE Design & Test of Computers 15(2): 14-21 (1998)

Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring of Self-Checking Systems. J. Electronic Testing 12(1-2): 81-92 (1998)

Marcelo Lubaszewski, Bernard Courtois: A Reliable Fail-Safe System. IEEE Trans. Computers 47(2): 236-241 (1998)

Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois: Microsystems Testing: an Approach and Open Problems. DATE 1998: 524-528

S. J. Abou-Samra, P. A. Aisa, Alain Guyot, Bernard Courtois: 3D CMOS SOL for high performance computing. ISLPED 1998: 54-58

A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois: Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550

Jean-Michel Karam, Bernard Courtois, Hicham Boutamine: CAD Tools for Bridging Microsystems and Foundries. IEEE Design & Test of Computers 14(2): 34-39 (1997)

Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: CAD and Foundries for Microsystems. DAC 1997: 674-679

Klaus Hofmann, Manfred Glesner, Nicu Sebe, A. Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois: Generation of the HDL-A-model of a micromembrane from its finite-element-description. ED&TC 1997: 108-112

Vladimir Székely, Márta Rencz, Bernard Courtois: Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS 1997: 440-445

Bozena Kaminska, Bernard Courtois: Guest Editors' Introduction: Mixed Analog and Digital Systems. IEEE Design & Test of Computers 13(2): 8-9 (1996)

Bernard Courtois: Second Therminic Workshop. IEEE Design & Test of Computers 13(4): 5- (1996)

Bozena Kaminska, Bernard Courtois: Guest editorial. J. Electronic Testing 9(1-2): 7-8 (1996)

Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electronic Testing 9(1-2): 43-57 (1996)

Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Unified built-in self-test for fully differential analog circuits. J. Electronic Testing 9(1-2): 135-151 (1996)

Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288

Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois: Conference Reports. IEEE Design & Test of Computers 12(4): 95-97 (1995)

Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois: Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995)

Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Analog checkers with absolute and relative tolerances. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995)

Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri: Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189-

Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski: Frequency-based BIST for analog circuit testin. VTS 1995: 54-59

Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois: Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490

Vladimir Kolarik, Marcelo Lubaszewski, Bernard Courtois: Designing self-exercising analogue checkers. VTS 1994: 252-257

F. L. Vargas, Michael Nicolaidis, Bernard Courtois: Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. ICCD 1993: 596-600

Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski: Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC 1992: 120-129

Marcelo Lubaszewski, Bernard Courtois: On the Design of Self-Checking Boundary Scannable Boards. ITC 1992: 372-381

Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois: Built-In Self-Test for Multi-Port RAMs. ICCAD 1991: 248-251

M. Marzouki, J. Laurent, Bernard Courtois: Coupling Electron-Beam Probing with Knowledge-Based Fault Localization. ITC 1991: 238-247

P. Bondono, Ahmed Amine Jerraya, A. Hornik, Bernard Courtois, D. Bonifas: NAUTILE: a safe environment for silicon compilation. EURO-DAC 1990: 605-609

René David, Antoine Fuentes, Bernard Courtois: Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989)

Michael Nicolaidis, S. Noraz, Bernard Courtois: A generalized theory of fail-safe systems. FTCS 1989: 398-406

Ingrid Jansch, Bernard Courtois: Definition and Design of Strongly Language Disjoint Checkers. IEEE Trans. Computers 37(6): 745-748 (1988)

Michael Nicolaidis, Bernard Courtois: Strongly Code Disjoint Checkers. IEEE Trans. Computers 37(6): 751-756 (1988)

Jean Paul Caisso, Bernard Courtois: Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. ITC 1988: 94-101

Ahmed Amine Jerraya, P. Varinot, R. Jamier, Bernard Courtois: Principles of the SYCO compiler. DAC 1986: 715-721

J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin: Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. ITC 1986: 465-473

H. Sahami, Bernard Courtois: Functional testing vs. structural testing of RAMs. Fehlertolerierende Rechensysteme 1984: 391-403

Bernard Courtois: Analytical Testing of Data Processing Sections of Integrated CPUs. ITC 1981: 21-30