Alfred L. Crouch Coauthor index pubzone.org

Al Crouch

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c18Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers: Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. ITC 2012: 1-10
2009
j8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Miron Abramovici, Al Crouch: We need more standards like IEEE 1500. IEEE Design & Test of Computers 26(1): 104 (2009)
c17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Ken Posse, Al Crouch, Jeff Rearick: IEEE P1687 IJTAG a presentation of current technology. ITC 2009: 1
2008
c16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Jason Doege, Alfred L. Crouch: The Advantages of Limiting P1687 to a Restricted Subset. ITC 2008: 1-8
2007
j7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Zahi S. Abuhamdeh, Bob Hannagan, Jeff Remmers, Alfred L. Crouch: A Production IR-Drop Screen on a Chip. IEEE Design & Test of Computers 24(3): 216-224 (2007)
c15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Alfred L. Crouch, Phil Burlison, Dennis J. Ciplickas: Processing High Volume Scan Test Results for Yield Learning. ISQED 2007: 293-298
c14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Zahi S. Abuhamdeh, Vincent D'Alassandro, Richard Pico, Dale Montrone, Alfred L. Crouch, Andrew Tracy: Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip. ITC 2007: 1-10
c13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Alfred L. Crouch: IJTAG: The path to organized instrument connectivity. ITC 2007: 1-10
2006
c12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Zahi S. Abuhamdeh, Philip Pears, Jeff Remmers, Alfred L. Crouch, Bob Hannagan: Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks. ITC 2006: 1-8
c11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, J.-F. Cote: IEEE P1687: Toward Standardized Access of Embedded Instrumentation. ITC 2006: 1-8
2005
c10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts: IJTAG (internal JTAG): a step toward a DFT standard. ITC 2005: 8
2004
c9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Alfred L. Crouch: Future Trends in Test: The Adoption and Use of Low Cost Structural Testers. ITC 2004: 698-703
2003
j6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Alfred L. Crouch, John C. Potter, Jason Doege: AC Scan Path Selection for Physical Debugging. IEEE Design & Test of Computers 20(5): 34-40 (2003)
2002
c8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Alfred L. Crouch: Testing the Tester: What Broke? Where? When? Why? ITC 2002: 28
2001
j5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Jay Bedsole, Rajesh Raina, Al Crouch, Magdy S. Abadir: Very Low Cost Testers: Opportunities and Challenges. IEEE Design & Test of Computers 18(5): 60-69 (2001)
2000
j4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran: Test Development for a Third-Version ColdFire Microprocessor. IEEE Design & Test of Computers 17(4): 29-37 (2000)
c7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Bahram Pouya, Alfred L. Crouch: Optimization trade-offs for vector volume and test power. ITC 2000: 873-881
1999
j3no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Al Crouch: The DFT Psychic Network. IEEE Design & Test of Computers 16(1): 96- (1999)
c6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran: The testability features of the 3rd generation ColdFire family of microprocessors. ITC 1999: 913-922
1998
j2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja: Test Development for Second-Generation ColdFire Microprocessors. IEEE Design & Test of Computers 15(3): 70-76 (1998)
c5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh: Best Methods for At-Speed Testing? VTS 1998: 460-461
1997
j1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Al Crouch, Jeff Freeman: Designing and Verifying Embedded Microprocessors. IEEE Design & Test of Computers 14(4): 87-94 (1997)
c4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason: A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. ITC 1997: 424-432
1994
c3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Alfred L. Crouch, Matthew Pressly, Joe Circello: Testabilty Features of the MC 68060 Microprocessor. ITC 1994: 60-69
c2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Alfred L. Crouch, Rick Ramus, Colin Maunder: Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution. ITC 1994: 660-669
1989
c1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Andy Halliday, Greg Young, Alfred L. Crouch: Prototype Testing Simplified by Scannable Buffers and Latches. ITC 1989: 174-181

Coauthor Index

1Magdy S. Abadir
[j5]
2Miron Abramovici
[j8]
3Zahi S. Abuhamdeh
[j7] [c14] [c12]
4Dale Amason
[j2] [c4]
5Steve Baird
[c5]
6Jay Bedsole
[j5]
7Ben Bennetts (R. G. Bennetts)
[c11] [c10]
8Phil Burlison
[c15]
9Dennis J. Ciplickas
[c15]
10Joe Circello
[c3]
11Zoe Conroy
[c18]
12J.-F. Cote
[c11]
13Vincent D'Alassandro
[c14]
14Jason Doege
[c16] [c11] [j6]
15Renny Eisele
[j2] [c4]
16Bill Eklow (William Eklow)
[c11] [c10]
17Jeff Freeman
[j1]
18Grady Giles
[j2] [c4]
19James J. Grealish
[c18]
20Andy Halliday
[c1]
21Bob Hannagan
[j7] [c12]
22Mike Laisne
[c11]
23Michael Mateja
[j4] [c6] [j2] [c4]
24Colin Maunder
[c2]
25Peter C. Maxwell
[c5]
26Teresa L. McLaurin
[j4] [c6]
27Skip Meyers
[c18]
28Harrison Miles
[c18]
29Dale Montrone
[c14]
30Wayne M. Needham
[c5]
31Phil Nigh
[c5]
32Philip Pears
[c12]
33Richard Pico
[c14]
34Ken Posse
[c17] [c11] [c10]
35John C. Potter
[j6] [j4] [c6]
36Bahram Pouya
[c7]
37Matthew Pressly
[c3]
38Rajesh Raina
[j5]
39Rick Ramus
[c2]
40Jeff Rearick
[c17] [c11] [c10]
41Jeff Remmers
[j7] [c12]
42Mike Ricchetti
[c11]
43Anthony J. Suto
[c18]
44Andrew Tracy
[c14]
45Dat Tran
[j4] [c6]
46Greg Young
[c1]

Colors in the list of coauthors

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