Alexander Czutro

Alejandro Czutro

	2012
c19		Alexander Czutro, Michael E. Imhof, J. Jiang, Abdullah Mumtaz, Matthias Sauer, Bernd Becker, Ilia Polian, Hans-Joachim Wunderlich: Variation-Aware Fault Grading. ATS 2012: 344-349
c18		Jie Jiang, Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian: On the optimality of K longest path generation algorithm under memory constraints. DATE 2012: 418-423
c17		Linus Feiten, Matthias Sauer, Tobias Schubert, Alexander Czutro, Eberhard Böhl, Ilia Polian, Bernd Becker: #SAT-based vulnerability analysis of security components - A case study. DFT 2012: 49-54
c16		Alexander Czutro, Matthias Sauer, Ilia Polian, Bernd Becker: Multi-conditional SAT-ATPG for power-droop testing. European Test Symposium 2012: 1-6
c15		Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian: On the quality of test vectors for post-silicon characterization. European Test Symposium 2012: 1-6
c14		Matthias Sauer, Alexander Czutro, Ilia Polian, Bernd Becker: Small-delay-fault ATPG with waveform accuracy. ICCAD 2012: 30-36
c13		Matthias Sauer, Stefan Kupferschmid, Alexander Czutro, Ilia Polian, Sudhakar M. Reddy, Bernd Becker: Functional test of small-delay faults using SAT and Craig interpolation. ITC 2012: 1-8
c12		Matthias Sauer, Stefan Kupferschmid, Alejandro Czutro, Sudhakar M. Reddy, Bernd Becker: Analysis of Reachable Sensitisable Paths in Sequential Circuits with SAT and Craig Interpolation. VLSI Design 2012: 382-387
c11		Alexander Czutro, Matthias Sauer, Tobias Schubert, Ilia Polian, Bernd Becker: SAT-ATPG using preferences for improved detection of complex defect mechanisms. VTS 2012: 170-175
	2011
c10		Matthias Sauer, Jie Jiang, Alejandro Czutro, Ilia Polian, Bernd Becker: Efficient SAT-Based Search for Longest Sensitisable Paths. Asian Test Symposium 2011: 108-113
c9		Matthias Sauer, Alexander Czutro, Tobias Schubert, Stefan Hillebrecht, Ilia Polian, Bernd Becker: SAT-based analysis of sensitisable paths. DDECS 2011: 93-98
c8		Matthias Sauer, Alejandro Czutro, Ilia Polian, Bernd Becker: Estimation of component criticality in early design steps. IOLTS 2011: 104-110
	2010
j2		Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis. International Journal of Parallel Programming 38(3-4): 185-202 (2010)
	2009
c7		Alejandro Czutro, Ilia Polian, Piet Engelke, Sudhakar M. Reddy, Bernd Becker: Dynamic Compaction in SAT-Based ATPG. Asian Test Symposium 2009: 187-190
c6		Marc Hunger, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, Bernd Becker: ATPG-based grading of strong fault-secureness. IOLTS 2009: 269-274
c5		Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker: TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis. VLSI Design 2009: 227-232
c4		Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker: An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. VTS 2009: 21-26
	2008
c3		Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker: A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. European Test Symposium 2008: 113-118
	2007
j1		Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker: Power Droop Testing. IEEE Design & Test of Computers 24(3): 276-284 (2007)
i1		Ilia Polian, Alejandro Czutro, Bernd Becker: Evolutionary Optimization in Code-Based Test Compression. CoRR abs/0710.4670 (2007)
	2006
c2		Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker: Power Droop Testing. ICCD 2006
	2005
c1		Ilia Polian, Alejandro Czutro, Bernd Becker: Evolutionary Optimization in Code-Based Test Compression. DATE 2005: 1124-1129

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