R. David

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	1997
j3		R. David, Janusz A. Brzozowski, Helmut Jürgensen: Testing for Bounded Faults in RAMs. J. Electronic Testing 10(3): 197-214 (1997)
c2		V. Prepin, R. David: Fault coverage of a long random test sequence estimated from a short simulation. VTS 1997: 391-398
	1990
j2		R. David: Some Results on Higher Suslin Trees. J. Symb. Log. 55(2): 526-536 (1990)
	1984
c1		Yves Dallery, R. David: Some New Results on Operational Analysis. Performance 1984: 119-134
	1979
j1		R. David, R. Tellez-Giron: Comments on ``The Error Latency of a Fault in a Sequential Digital Circuit''. IEEE Trans. Computers 28(1): 85-86 (1979)

Coauthor Index

1	Janusz A. Brzozowski (John Brzozowski)	[j3]
2	Yves Dallery	[c1]
3	Helmut Jürgensen	[j3]
4	V. Prepin	[c2]
5	R. Tellez-Giron	[j1]

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