| 2010 | ||
|---|---|---|
| j1 | Sholom M. Weiss, Robert J. Baseman, Fateh Tipu, Christopher N. Collins, William A. Davies, Raminderpal Singh, John W. Hopkins: Rule-based data mining for yield improvement in semiconductor manufacturing. Appl. Intell. 33(3): 318-329 (2010) | |
| 1 | Robert J. Baseman | |
| 2 | Christopher N. Collins | |
| 3 | John W. Hopkins | |
| 4 | Raminderpal Singh | |
| 5 | Fateh Tipu | |
| 6 | Sholom M. Weiss |
Data released under the ODC-BY 1.0 license — See also our legal information page