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 | 2005 | |
|---|---|---|
| j3 |      | A. Sozza, Christian Dua, Erwan Morvan, B. Grimber, S. L. Delage: A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. Microelectronics Reliability 45(9-11): 1617-1621 (2005) |
| 2003 | ||
| j2 | | S. L. Delage, Christian Dua: Wide band gap semiconductor reliability : Status and trends. Microelectronics Reliability 43(9-11): 1705-1712 (2003) |
| 2001 | ||
| j1 |  | Cezary Sydlo, Bastian Mottet, Husin Ganis, Hans L. Hartnagel, Viktor Krozer, S. L. Delage, Simone Cassette, Eric Chartier, D. Floriot, Steven Bland: Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. Microelectronics Reliability 41(9-10): 1567-1571 (2001) |
| 1 | Steven Bland | |
| 2 | Simone Cassette | |
| 3 | Eric Chartier | |
| 4 | Christian Dua | |
| 5 | D. Floriot | |
| 6 | Husin Ganis | |
| 7 | B. Grimber | |
| 8 | Hans L. Hartnagel | |
| 9 | Viktor Krozer | |
| 10 | Erwan Morvan | |
| 11 | Bastian Mottet | |
| 12 | A. Sozza | |
| 13 | Cezary Sydlo |
Colors in the list of coauthors
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