Shurong Dong

Jian Wu, Shurong Dong, Mingliang Li, Meng Miao, Fei Ma, Jianfeng Zheng, Yan Han: A novel power-clamp assisted complementary MOSFET for robust ESD protection. Microelectronics Reliability 52(8): 1593-1597 (2012)

Meng Miao, Shurong Dong, Mingliang Li, Jian Wu, Fei Ma, Jianfeng Zheng, Yan Han: A novel gate-suppression technique for ESD protection. Microelectronics Reliability 52(8): 1598-1601 (2012)

Fei Ma, Yan Han, Shurong Dong, Meng Miao, Jianfeng Zheng, Jian Wu, Cheng-gong Han, Kehan Zhu: Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process. Microelectronics Reliability 52(8): 1640-1644 (2012)

Yan Han, Bo Song, Shurong Dong, Mingliang Li, Fei Ma, Meng Miao, Kehan Zhu: Study of current saturation behaviors in dual direction SCR for ESD applications. Microelectronics Reliability 51(2): 332-336 (2011)

Fei Ma, Yan Han, Bo Song, Shurong Dong, Meng Miao, Jianfeng Zheng, Jian Wu, Kehan Zhu: Substrate-engineered GGNMOS for low trigger voltage ESD in 65 nm CMOS process. Microelectronics Reliability 51(12): 2124-2128 (2011)

Bo Song, Yan Han, Shurong Dong, Fei Ma, Mingliang Li, Meng Miao, Kehan Zhu: Compact MOS-triggered SCR with faster turn-on speed for ESD protection. Microelectronics Reliability 50(9-11): 1393-1397 (2010)

Huijin Zhang, Shurong Dong, Weiwei Chen, Yan Han: MIMO multiplexer based on film bulk acoustic resonator. IEEE Trans. Consumer Electronics 56(2): 805-810 (2010)

Xiaoyang Du, Shurong Dong, Yan Han, Juin J. Liou, Mingxu Huo, You Li, Qiang Cui, Dahai Huang, Demiao Wang: Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology. Microelectronics Reliability 48(7): 995-999 (2008)