Kiran B. Doreswamy

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	2003
c5		Manan Syal, Michael S. Hsiao, Kiran B. Doreswamy, Sreejit Chakravarty: Efficient Implication - Based Untestable Bridge Fault Identifier. VTS 2003: 393-402
	2000
j1		Surendra Bommu, Kiran B. Doreswamy, Srimat T. Chakradhar: A Practical Vector Restoration Technique for Large Sequential Circuits. J. Electronic Testing 16(5): 521-539 (2000)
c4		Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy: Resource-Constrained Compaction of Sequential Circuit Test Sets. VLSI Design 2000: 398-405
	1998
c3		Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy: Vector Restoration Using Accelerated Validation and Refinement. Asian Test Symposium 1998: 458-466
c2		Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy: Static compaction using overlapped restoration and segment pruning. ICCAD 1998: 140-146
c1		Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy: Static test sequence compaction based on segment reordering and accelerated vector restoration. ITC 1998: 954-961

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