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Christian Dua

2000 – 2009

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2009
[j7]
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  dblp key:
  - journals/mr/MalbertLCSHJDDDOBBC09
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N. Malbert, Nathalie Labat, A. Curutchet, C. Sury, V. Hoel, J.-C. de Jaeger, N. Defrance, Y. Douvry, Christian Dua, Mourad Oualli, C. Bru-Chevallier, J.-M. Bluet, W. Chikhaoui: Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs. Microelectronics Reliability 49(9-11): 1216-1221 (2009)
[j6]
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  dblp key:
  - journals/mr/PiazzaDOMCW09
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Michele Piazza, Christian Dua, Mourad Oualli, Erwan Morvan, Dominique Carisetti, Frédéric Wyczisk: Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs. Microelectronics Reliability 49(9-11): 1222-1225 (2009)
2007
[j5]
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  dblp key:
  - journals/mr/FaqirVFDRMZCCLTD07
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M. Faqir, G. Verzellesi, Fausto Fantini, Francesca Danesin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Anna Cavallini, Antonio Castaldini, Nathalie Labat, André Touboul, Christian Dua: Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs. Microelectronics Reliability 47(9-11): 1639-1642 (2007)
2006
[j4]
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  dblp key:
  - journals/mr/SozzaCDMLT06
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A. Sozza, A. Curutchet, Christian Dua, N. Malbert, Nathalie Labat, André Touboul: AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements. Microelectronics Reliability 46(9-11): 1725-1730 (2006)
2005
[j3]
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  dblp key:
  - journals/mr/SozzaDMGD05
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A. Sozza, Christian Dua, Erwan Morvan, B. Grimber, S. L. Delage: A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. Microelectronics Reliability 45(9-11): 1617-1621 (2005)
2004
[j2]
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  dblp key:
  - journals/mr/SozzaDKBZ04
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A. Sozza, Christian Dua, A. Kerlain, C. Brylinski, Enrico Zanoni: Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET. Microelectronics Reliability 44(7): 1109-1113 (2004)
2003
[j1]
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  dblp key:
  - journals/mr/DelageD03
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S. L. Delage, Christian Dua: Wide band gap semiconductor reliability : Status and trends. Microelectronics Reliability 43(9-11): 1705-1712 (2003)