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Jennifer Dworak
2010 – today
- 2013
[c28]Mitchell A. Thornton, Jennifer Dworak: Ternary Logic Network Justification Using Transfer Matrices. ISMVL 2013: 310-315- 2012
- [j5]Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak: NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test. IEEE Trans. on CAD of Integrated Circuits and Systems 31(5): 809-813 (2012)
- [j4]Jennifer Dworak, Kundan Nepal, Nuno Alves, Yiwen Shi, Nicholas Imbriglia, R. Iris Bahar: Using implications to choose tests through suspect fault identification. ACM Trans. Design Autom. Electr. Syst. 18(1): 14 (2012)
- 2011
- [c27]Nuno Alves, Y. Shi, Nicholas Imbriglia, Jennifer Dworak, Kundan Nepal, R. Iris Bahar: Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. European Test Symposium 2011: 211
- [c26]Yiwen Shi, Kantapon Kaewtip, Wan-Chan Hu, Jennifer Dworak: Partial state monitoring for fault detection estimation. ITC 2011: 1-10
- [c25]Nuno Alves, Yiwen Shi, Jennifer Dworak, R. Iris Bahar, Kundan Nepal: Enhancing online error detection through area-efficient multi-site implications. VTS 2011: 241-246
- 2010
- [j3]Nuno Alves, Alison Buben, Kundan Nepal, Jennifer Dworak, R. Iris Bahar: A Cost Effective Approach for Online Error Detection Using Invariant Relationships. IEEE Trans. on CAD of Integrated Circuits and Systems 29(5): 788-801 (2010)
- [j2]Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak: On Reducing Scan Shift Activity at RTL. IEEE Trans. on CAD of Integrated Circuits and Systems 29(7): 1110-1120 (2010)
- [c24]Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel: NIM- a noise index model to estimate delay discrepancies between silicon and simulation. DATE 2010: 1373-1376
- [c23]Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar: Improving the testability and reliability of sequential circuits with invariant logic. ACM Great Lakes Symposium on VLSI 2010: 131-134
- [c22]Yiwen Shi, Wan-Chan Hu, Jennifer Dworak: Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects. VTS 2010: 319-324
2000 – 2009
- 2009
- [c21]Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar: Detecting errors using multi-cycle invariance information. DATE 2009: 791-796
- [c20]Nuno Alves, Jennifer Dworak, R. Iris Bahar, Kundan Nepal: Compacting test vector sets via strategic use of implications. ICCAD 2009: 83-88
- 2008
- [c19]Yiwen Shi, Kellie DiPalma, Jennifer Dworak: Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization. DFT 2008: 403-411
- [c18]Kundan Nepal, Nuno Alves, Jennifer Dworak, R. Iris Bahar: Using Implications for Online Error Detection. ITC 2008: 1-10
- [c17]Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak: Reducing Scan Shift Power at RTL. VTS 2008: 139-146
- 2007
- [c16]Jennifer Dworak: Which defects are most critical? optimizing test sets to minimize failures due to test escapes. ITC 2007: 1-10
- [c15]Jennifer Dworak: An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting. VTS 2007: 205-210
- 2006
- [c14]Vladimir Stojanovic, R. Iris Bahar, Jennifer Dworak, Richard Weiss: A cost-effective implementation of an ECC-protected instruction queue for out-of-order microprocessors. DAC 2006: 705-708
- 2005
- [c13]Jennifer Dworak: An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects. MTV 2005: 48-54
- 2004
- [c12]Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer: Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. DATE 2004: 1066-1071
- [c11]Jennifer Dworak, James Wingfield, M. Ray Mercer: A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects. DFT 2004: 460-468
- [c10]Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer: Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. VTS 2004: 9-15
- 2003
- [c9]James Wingfield, Jennifer Dworak, M. Ray Mercer: Function-Based Dynamic Compaction and its Impact on Test Set Sizes. DFT 2003: 167-174
- 2002
- [c8]Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC 2002: 371-374
- [c7]Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael R. Grimaila, M. Ray Mercer: A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults. DATE 2002: 94-99
- [c6]Jennifer Dworak, James Wingfield, Brad Cobb, Sooryong Lee, Li-C. Wang, M. Ray Mercer: Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. DFT 2002: 177-185
- [c5]Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. ITC 2002: 407-416
- 2001
- [j1]Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang: Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Design & Test of Computers 18(1): 31-41 (2001)
- 2000
- [c4]Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer: On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. Asian Test Symposium 2000: 151-
- [c3]Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer: Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. ITC 2000: 930-939
1990 – 1999
- 1999
- [c2]Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer: Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. ITC 1999: 1031-1037
- [c1]Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer: REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274
Coauthor Index
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last updated on 2013-06-13 23:10 CEST by the dblp team