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R. Ecoffet
2000 – 2009
- 2005
[c2]Raoul Velazco, R. Ecoffet, F. Faure: How to Characterize the Problem of SEU in Processors and Representative Errors Observed on Flight. IOLTS 2005: 303-308- 2000
[c1]Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet: An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW 2000: 52-
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last updated on 2012-12-02 22:01 CET by the dblp team



