| 1991 | ||
|---|---|---|
| j4 | Edward B. Eichelberger, Stephen E. Bello: Differential current switch-High performance at low power. IBM Journal of Research and Development 35(3): 313-320 (1991) | |
| 1989 | ||
| j3 | John A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Orazio P. Forlenza: A Method for Generating Weighted Random Test Patterns. IBM Journal of Research and Development 33(2): 149-161 (1989) | |
| 1985 | ||
| c6 | ||
| c5 | John A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Donato O. Forlenza, Tim McCarthy: A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation. ITC 1985: 779-784 | |
| 1983 | ||
| j2 | Edward B. Eichelberger, Eric Lindbloom: Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test. IBM Journal of Research and Development 27(3): 265-272 (1983) | |
| c4 | Franco Motika, John A. Waicukauski, Edward B. Eichelberger, Eric Lindbloom: An LSSD Pseudo Random Pattern Test System. ITC 1983: 283-288 | |
| 1980 | ||
| j1 | Edward B. Eichelberger, Eric Lindbloom: A Heuristic Test-Pattern Generator for Programmable Logic Arrays. IBM Journal of Research and Development 24(1): 15-22 (1980) | |
| 1977 | ||
| c3 | Edward B. Eichelberger, Thomas W. Williams: A logic design structure for LSI testability. DAC 1977: 462-468 | |
| 1964 | ||
| c2 | Edward B. Eichelberger: Hazard detection in combinational and sequential switching circuits. SWCT (FOCS) 1964: 111-120 | |
| 1963 | ||
| c1 | ||
| 1 | Stephen E. Bello | |
| 2 | Donato O. Forlenza | |
| 3 | Orazio P. Forlenza | |
| 4 | Eric Lindbloom | |
| 5 | Tim McCarthy | |
| 6 | Franco Motika | |
| 7 | John A. Waicukauski | |
| 8 | Thomas W. Williams |
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