Bill Eklow

Li Jiang, Qiang Xu, Bill Eklow: On Effective Through-Silicon Via Repair for 3-D-Stacked ICs. IEEE Trans. on CAD of Integrated Circuits and Systems 32(4): 559-571 (2013)

Bill Eklow: Managing Complex Boundary-Scan Operations. IEEE Design & Test of Computers 29(2): 100-102 (2012)

Qiang Xu, Li Jiang, Huiyun Li, Bill Eklow: Yield enhancement for 3D-stacked ICs: Recent advances and challenges. ASP-DAC 2012: 731-737

Li Jiang, Qiang Xu, Bill Eklow: On effective TSV repair for 3D-stacked ICs. DATE 2012: 793-798

Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson: Re-using chip level DFT at board level. European Test Symposium 2012: 1

Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow: FALCON: Rapid statistical fault coverage estimation for complex designs. ITC 2012: 1-10

Bill Eklow: Major Milestones for Two IEEE Standards Groups in 2011. IEEE Design & Test of Computers 28(6): 85-87 (2011)

Bill Eklow, R. D. (Shawn) Blanton (Eds.): 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. IEEE 2011, isbn 978-1-4577-0153-5

Luca Amati, Cristiana Bolchini, Laura Frigerio, Fabio Salice, William Eklow, Arnold Suvatne, Eugenio Brambilla, Federico Franzoso, Michele Martin: An Incremental Approach to Functional Diagnosis. DFT 2009: 392-400

Gordon W. Roberts, Bill Eklow (Eds.): 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. IEEE 2009, isbn 978-1-4244-4868-5

Brice Achkir, Pavel Zivny, Bill Eklow: Parametric Testing of Optical Interfaces. ITC 2008: 1

John Malian, Bill Eklow: Embedded Testing in an In-Circuit Test Environment. ITC 2008: 1-6

Bill Eklow, Ben Bennetts: New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). European Test Symposium 2006: 253-254

Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, J.-F. Cote: IEEE P1687: Toward Standardized Access of Embedded Instrumentation. ITC 2006: 1-8

Sylvain Tourangeau, Bill Eklow: Test Economics - What can a Board/System Test Engineer do to Influence Supply Operation Metrics. ITC 2006: 1-9

Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow: A practical perspective on reducing ASIC NTFs. ITC 2005: 7

Bill Eklow: An update on IEEE 1149.6 - successes and issues. ITC 2005: 7

Carlos O'Farrill, Merouane Moakil-Chbany, Bill Eklow: Optimized reasoning-based diagnosis for non-random, board-level, production defects. ITC 2005: 7

Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts: IJTAG (internal JTAG): a step toward a DFT standard. ITC 2005: 8

Bill Eklow: IP Testing - The Future Differentiator? DATE 2004: 6-9

Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts: Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE 2004: 1184-1191

Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski: Realizing High Test Quality Goals with Smart Test Resource Usage. ITC 2004: 525-533

Bill Eklow, Anoosh Hosseini, Chi Khuong, Shyam Pullela, Toai Vo, Hien Chau: Simulation Based System Level Fault Insertion Using Co-verification Tools. ITC 2004: 704-710

Sunil Kalidindi, Nghia Huynh, Bill Eklow, Josh Goldstein: "Real Life" System Testing of Networking Equipment. ITC 2004: 1072-1077

Bill Eklow: What Do You Mean My Board Test Stinks? ITC 2004: 1423

Bill Eklow, Carl Barnhart, Kenneth P. Parker: IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. IEEE Design & Test of Computers 20(5): 76-83 (2003)

Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz: IEEE 1149.6 - A Practical Perspective. ITC 2003: 494-502

Bill Eklow, Carl Barnhart, Kenneth P. Parker: IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. ITC 2002: 1056-1065

Bill Eklow: Is Board Test Worth Talking About? ITC 2002: 1235

William Eklow, Richard M. Sedmak, Dan Singletary, Toai Vo: Unsafe board states during PC-based boundary-scan testing. ITC 2001: 615-623

Bulent I. Dervisoglu, Mike Ricchetti, William Eklow: Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard. ITC 1998: 980-989

William Eklow: Optimizing Boundary Scan in a Proprietary Environment. ITC 1994: 1024