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You can find the classic dblp view of this page here.
M. Estrada
2000 – 2009
- 2009
[j3]J. C. Sánchez, M. Estrada: Stability of the J-V characteristics of (BEHP-PPV)-co-(MEH-PPV) based light-emitting diodes. Microelectronics Reliability 49(12): 1503-1507 (2009)- 2008
[j2]I. Mejia, M. Estrada, M. Avila: Improved upper contacts PMMA on P3HT PTFTS using photolithographic processes. Microelectronics Reliability 48(11-12): 1795-1799 (2008)- 2004
[j1]V. Sánchez, J. Munguía, M. Estrada: Photo-CVD process for ultra thin SiO2 films. Microelectronics Reliability 44(5): 885-888 (2004)
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last updated on 2012-12-02 21:28 CET by the dblp team



