M. Fadlallah

H. Ayad, M. Fadlallah, H. Youssef, H. Elmokdad, F. Ndagijimana, Jalal Jomaah: Performances of low profile dipole antenna AMC-based surface using metamaterials structures. ICT 2012: 1-5

C. Petit, A. Meinertzhagen, D. Zander, O. Simonetti, M. Fadlallah, T. Maurel: Low voltage SILC and P- and N-MOSFET gate oxide reliability. Microelectronics Reliability 45(3-4): 479-485 (2005)

M. Fadlallah, C. Petit, A. Meinertzhagen, G. Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader: Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices. Microelectronics Reliability 43(9-11): 1433-1438 (2003)

M. Fadlallah, G. Ghibaudo, Jalal Jomaah, M. Zoaeter, G. Guégan: Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. Microelectronics Reliability 42(1): 41-46 (2002)

M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, Jalal Jomaah, G. Ghibaudo: Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta₂O₅ as gate dielectrics. Microelectronics Reliability 41(9-10): 1361-1366 (2001)