| 2008 | ||
|---|---|---|
| j1 | A. Grekov, Qingchun Zhang, Husna Fatima, Anant Agarwal, Tangali S. Sudarshan: Effect of crystallographic defects on the reverse performance of 4H-SiC JBS diodes. Microelectronics Reliability 48(10): 1664-1668 (2008) | |
| 1 | Anant Agarwal | |
| 2 | A. Grekov | |
| 3 | Tangali S. Sudarshan | |
| 4 | Qingchun Zhang |
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