| 2003 | ||
|---|---|---|
| c1 | Massimo Conti, Paolo Crippa, Francesco Fedecostunte, Simone Orcioni, F. Ricciardi, Claudio Turchetti, Loris Vendrame: A modular test structure for CMOS mismatch characterization. ISCAS (5) 2003: 569-572 | |
| 1 | Massimo Conti | |
| 2 | Paolo Crippa | |
| 3 | Simone Orcioni | |
| 4 | F. Ricciardi | |
| 5 | Claudio Turchetti | |
| 6 | Loris Vendrame |
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