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Farshad Firouzi
2010 – today
- 2013
[j3]Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori: Power-Aware Minimum NBTI Vector Selection Using a Linear Programming Approach. IEEE Trans. on CAD of Integrated Circuits and Systems 32(1): 100-110 (2013)- [c12]Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori: Statistical analysis of BTI in the presence of process-induced voltage and temperature variations. ASP-DAC 2013: 594-600
- [c11]Yuko Hara-Azumi, Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori: Instruction-set extension under process variation and aging effects. DATE 2013: 182-187
- [c10]Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori, Sani Nassif: Incorporating the impacts of workload-dependent runtime variations into timing analysis. DATE 2013: 1022-1025
- [c9]Saman Kiamehr, Farshad Firouzi, Mehdi Baradaran Tahoori: Aging-aware timing analysis considering combined effects of NBTI and PBTI. ISQED 2013: 53-59
- 2012
- [j2]Farshad Firouzi, Ali Azarpeyvand, Mostafa E. Salehi, Sied Mehdi Fakhraie: Adaptive fault-tolerant DVFS with dynamic online AVF prediction. Microelectronics Reliability 52(6): 1197-1208 (2012)
- [c8]Fabian Oboril, Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori: Reducing NBTI-induced processor wearout by exploiting the timing slack of instructions. CODES+ISSS 2012: 443-452
- [c7]Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori: NBTI mitigation by optimized NOP assignment and insertion. DATE 2012: 218-223
- [c6]Saman Kiamehr, Farshad Firouzi, Mehdi Baradaran Tahoori: Input and transistor reordering for NBTI and HCI reduction in complex CMOS gates. ACM Great Lakes Symposium on VLSI 2012: 201-206
- 2011
- [j1]Farshad Firouzi, Mostafa E. Salehi, Fan Wang, Sied Mehdi Fakhraie: An accurate model for soft error rate estimation considering dynamic voltage and frequency scaling effects. Microelectronics Reliability 51(2): 460-467 (2011)
- [c5]Farshad Firouzi, Amir Yazdanbakhsh, Hamed Dorosti, Sied Mehdi Fakhraie: Dynamic Soft Error Hardening via Joint Body Biasing and Dynamic Voltage Scaling. DSD 2011: 385-392
- [c4]Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori: A linear programming approach for minimum NBTI vector selection. ACM Great Lakes Symposium on VLSI 2011: 253-258
- [c3]Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori: Modeling and estimation of power supply noise using linear programming. ICCAD 2011: 537-542
- 2010
- [c2]Ali Azarpeyvand, Mostafa E. Salehi, Farshad Firouzi, Amir Yazdanbakhsh, Sied Mehdi Fakhraie: Instruction reliability analysis for embedded processors. DDECS 2010: 20-23
- [c1]Farshad Firouzi, Mostafa E. Salehi, Fan Wang, Sied Mehdi Fakhraie, Saeed Safari: Reliability-Aware Dynamic Voltage and Frequency Scaling. ISVLSI 2010: 304-309
Coauthor Index
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last updated on 2013-06-11 21:33 CEST by the dblp team