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 | 2010 | |
|---|---|---|
| c6 |      | James Crafts, David Bogdan, Dennis Conti, Donato O. Forlenza, Orazio P. Forlenza, William V. Huott, Mary P. Kusko, Edward Seymour, Timothy Taylor, Brian Walsh: Testing the IBM Power 7™ 4 GHz eight core microprocessor. ITC 2010: 49-58 |
| 2009 | ||
| j1 | | G. Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, Orazio P. Forlenza, R. J. Frishmuth, Rona Yaari, S. Michnowski, U. Baur: Structural and functional test of IBM System z10 chips. IBM Journal of Research and Development 53(1): 5 (2009) |
| c5 | | Franco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza: On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). ITC 2009: 1-10 |
| 1999 | ||
| c4 | | Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong: Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC 1999: 1152-1161 |
| 1997 | ||
| c3 | | Phil Nigh, Donato O. Forlenza, Franco Motika: Application and Analysis of IDDQ Diagnostic Software. ITC 1997: 319-327 |
| 1990 | ||
| c2 | | J. Gartner, B. Driscoll, Donato O. Forlenza, Orazio P. Forlenza, Timothy J. Koprowski, T. Lizambri, R. Olsen, S. Robertson, P. Ryan, A. Walter: Weighted random test program generation for a per-pin tester. ITC 1990: 1000-1005 |
| 1985 | ||
| c1 |  | John A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Donato O. Forlenza, Tim McCarthy: A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation. ITC 1985: 779-784 |
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