Orazio P. Forlenza

James Crafts, David Bogdan, Dennis Conti, Donato O. Forlenza, Orazio P. Forlenza, William V. Huott, Mary P. Kusko, Edward Seymour, Timothy Taylor, Brian Walsh: Testing the IBM Power 7™ 4 GHz eight core microprocessor. ITC 2010: 49-58

G. Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, Orazio P. Forlenza, R. J. Frishmuth, Rona Yaari, S. Michnowski, U. Baur: Structural and functional test of IBM System z10 chips. IBM Journal of Research and Development 53(1): 5 (2009)

Franco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza: On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). ITC 2009: 1-10

J. Gartner, B. Driscoll, Donato O. Forlenza, Orazio P. Forlenza, Timothy J. Koprowski, T. Lizambri, R. Olsen, S. Robertson, P. Ryan, A. Walter: Weighted random test program generation for a per-pin tester. ITC 1990: 1000-1005

John A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Orazio P. Forlenza: A Method for Generating Weighted Random Test Patterns. IBM Journal of Research and Development 33(2): 149-161 (1989)