Masayasu Fukunaga

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	2007
c5		Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo: Estimation of delay test quality and its application to test generation. ICCAD 2007: 413-417
	2006
c4		Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato: A dynamic test compaction procedure for high-quality path delay testing. ASP-DAC 2006: 348-353
	2005
j1		Masayasu Fukunaga, Seiji Kajihara, Sadami Takeoka: On Statistical Estimation of Fault Efficiency for Path Delay Faults Based on Untestable Path Analysis. IEICE Transactions 88-D(7): 1671-1677 (2005)
c3		Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato: Path delay test compaction with process variation tolerance. DAC 2005: 845-850
	2003
c2		Masayasu Fukunaga, Seiji Kajihara, Sadami Takeoka, Shinichi Yosimura: On effective criterion of path selection for delay testing. ASP-DAC 2003: 757-762
c1		Masayasu Fukunaga, Seiji Kajihara, Sadami Takeoka: On Estimation of Fault Efficiency for Path Delay Faults. Asian Test Symposium 2003: 64-67

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