U. Gätzschmann

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	2006
c1		Christian Galke, U. Gätzschmann, Heinrich Theodor Vierhaus: Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes. DSD 2006: 433-438

Coauthor Index

1	Christian Galke	[c1]
2	Heinrich Theodor Vierhaus	[c1]

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