Michael Gössel

Thomas Rabenalt, Michael Richter, Frank Poehl, Michael Gössel: Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique. IEEE Trans. on CAD of Integrated Circuits and Systems 31(6): 950-957 (2012)

Thomas Rabenalt, Michael Gössel, Andreas Leininger: Masking of X-Values by Use of a Hierarchically Configurable Register. J. Electronic Testing 27(1): 31-41 (2011)

Michael Augustin, Michael Gössel, Rolf Kraemer: Implementation of Selective Fault Tolerance with conventional synthesis tools. DDECS 2011: 213-218

Michael Augustin, Michael Gössel, Rolf Kraemer: Selective fault tolerance for finite state machines. IOLTS 2011: 43-48

Thomas Rabenalt, Michael Richter, Michael Gössel: High Performance Compaction for Test Responses with Many Unknowns. Asian Test Symposium 2010: 179-184

Michael Augustin, Michael Gössel, Rolf Kraemer: Reducing the area overhead of TMR-systems by protecting specific signals. IOLTS 2010: 268-273

Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel: X-tolerant Test Data Compaction with Accelerated Shift Registers. J. Electronic Testing 25(4-5): 247-258 (2009)

Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger: Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. European Test Symposium 2009: 39-44

Thomas Rabenalt, Michael Gössel, Andreas Leininger: Masking of X-values by Use of a Hierarchically Configurable Register. European Test Symposium 2009: 149-154

Michael Richter, Michael Gössel: Concurrent checking with split-parity codes. IOLTS 2009: 159-163

Michael Gössel, Egor S. Sogomonyan: A Non-linear Split Error Detection Code. Fundam. Inform. 83(1-2): 109-115 (2008)

Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel: Accelerated Shift Registers for X-tolerant Test Data Compaction. European Test Symposium 2008: 133-139

Michael Richter, Klaus Oberländer, Michael Gössel: New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability. IOLTS 2008: 37-42

Frank Poehl, Matthias Beck, Ralf Arnold, Jan Rzeha, Thomas Rabenalt, Michael Gössel: On-chip evaluation, compensation and storage of scan diagnosis data. IET Computers & Digital Techniques 1(3): 207-212 (2007)

Andreas Leininger, Martin Fischer, Michael Richter, Michael Gössel: Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. ITC 2007: 1-9

Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld: Modulo p=3 Checking for a Carry Select Adder. J. Electronic Testing 22(1): 101-107 (2006)

Zhanglei Wang, Krishnendu Chakrabarty, Michael Gössel: Test set enrichment using a probabilistic fault model and the theory of output deviations. DATE 2006: 1270-1275

Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz: On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. European Test Symposium 2006: 239-246

Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. IOLTS 2006: 23-30

Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. Asian Test Symposium 2005: 76-81

Vitalij Ocheretnij, G. Kouznetsov, Ramesh Karri, Michael Gössel: On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations. IOLTS 2005: 141-146

Michael Gössel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger: A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST. J. Electronic Testing 20(6): 611-622 (2004)

A. Morozov, Michael Gössel, V. V. Saposhnikov, Vl. V. Saposhnikov: Complementary Circuits for On-Line Detection for 1-out-of-3 Codes. ARCS Workshops 2004: 76-83

Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel: Self-checking Carry-selectAdder with Sum-bit Duplication. ARCS Workshops 2004: 84-91

Andreas Leininger, Michael Gössel, Peter Muhmenthaler: Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. DATE 2004: 1302-1309

Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. DATE 2004: 1360-1361

V. V. Saposhnikov, Vl. V. Saposhnikov, A. Morozov, Michael Gössel: Necessary and Sufficient Conditions for the Existence of Totally Self-Checking Circuits. IOLTS 2004: 25-30

Vitalij Ocheretnij, Daniel Marienfeld, Egor S. Sogomonyan, Michael Gössel: Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. IOLTS 2004: 31-36

Kaijie Wu, Ramesh Karri, Grigori Kuznetsov, Michael Gössel: Low Cost Concurrent Error Detection for the Advanced Encryption Standard. ITC 2004: 1242-1248

Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel: Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output. IEEE Trans. Computers 52(12): 1646-1651 (2003)

Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan: Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst. 8(4): 491-505 (2003)

Ramesh Karri, Grigori Kuznetsov, Michael Gössel: Parity-Based Concurrent Error Detection of Substitution-Permutation Network Block Ciphers. CHES 2003: 113-124

Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld: A Modulo p Checked Self-Checking Carry Select Adder. IOLTS 2003: 25-29

Kartik Mohanram, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba: Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. IOLTS 2003: 35-

Ramesh Karri, Grigori Kuznetsov, Michael Gössel: Parity-Based Concurrent Error Detection in Symmetric Block Ciphers. ITC 2003: 919-926

Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty: Synthesis of single-output space compactors for scan-based sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 21(10): 1171-1179 (2002)

Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty: Robust Space Compaction of Test Responses. Asian Test Symposium 2002: 254-259

Chunsheng Liu, Krishnendu Chakrabarty, Michael Gössel: An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment. DATE 2002: 382-386

Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan: Partially Duplicated Code-Disjoint Carry-Skip Adder. DFT 2002: 78-86

Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking Code-Disjoint Carry-Skip Adder. IOLTW 2002: 39-43

Michael Gössel, Egor S. Sogomonyan, Adit D. Singh: Scan-Path with Directly Duplicated and Inverted Duplicated Registers. VTS 2002: 47-52

Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty: Synthesis of single-output space compactors with application to scan-based IP cores. ASP-DAC 2001: 496-502

Michael Gössel, Vitalij Ocheretnij, S. Chakrabarty: Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA. Asian Test Symposium 2001: 57-62

Vitalij Ocheretnij, Egor S. Sogomonyan, Michael Gössel: A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. Asian Test Symposium 2001: 365-

Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan: Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. IOLTW 2001: 147-152

A. Morozov, Michael Gössel, Krishnendu Chakrabarty, Bhargab B. Bhattacharya: Design of Parameterizable Error-Propagating Space Compactors for Response Observation. VTS 2001: 48-53

Egor S. Sogomonyan, A. A. Morosov, Jan Rzeha, Michael Gössel, Adit D. Singh: Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. VTS 2001: 184-189

Vitalij Ocheretnij, Michael Gössel, Vl. V. Saposhnikov, V. V. Saposhnikov: A New Method of Redundancy Addition for Circuit Optimization. EUROMICRO 2000: 1172-

A. Morozov, V. V. Saposhnikov, Vl. V. Saposhnikov, Michael Gössel: New Self-Checking Circuits by Use of Berger-Codes. IOLTW 2000: 141-146

Michael Gössel, Alexej Dmitriev, Vl. V. Saposhnikov, V. V. Saposhnikov: A New Method for Concurrent Checking by Use of a 1-out-of-4 Code. IOLTW 2000: 147-152

Debaleena Das, Nur A. Touba, Markus Seuring, Michael Gössel: Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes. IOLTW 2000: 171-

Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel: Zero-Aliasing Space Compression using a Single Periodic Output and its Application to Testing of Embedded Cores. VLSI Design 2000: 382-391

Vl. V. Saposhnikov, V. Moshanin, V. V. Saposhnikov, Michael Gössel: Experimental Results for Self-Dual Multi-Output Combinational Circuits. J. Electronic Testing 14(3): 295-300 (1999)

Egor S. Sogomonyan, Adit D. Singh, Michael Gössel: A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. J. Electronic Testing 15(1-2): 87-96 (1999)

Markus Seuring, Michael Gössel: A Structural Approach for Space Compaction for Sequential Circuits. DFT 1999: 227-

Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring: Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. ITC 1999: 286-293

Michael Gössel, A. A. Morosov, Egor S. Sogomonyan: A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. VTS 1999: 49-57

Markus Seuring, Michael Gössel: A Structural Method for Output Compaction of Sequential Automata Implemented as Circuits. WIA 1999: 158-163

V. V. Saposhnikov, A. A. Morosov, Vl. V. Saposhnikov, Michael Gössel: A New Design Method for Self-Checking Unidirectional Combinational Circuits. J. Electronic Testing 12(1-2): 41-53 (1998)

Sebastian T. J. Fenn, Michael Gössel, Mohammed Benaissa, David Taylor: On-Line Error Detection for Bit-Serial Multipliers in GF(2m). J. Electronic Testing 13(1): 29-40 (1998)

Vl. V. Saposhnikov, V. V. Saposhnikov, Alexej Dmitriev, Michael Gössel: Self-Dual Duplication for Error Detection. Asian Test Symposium 1998: 296-300

T. Bogue, Michael Gössel, Helmut Jürgensen, Yervant Zorian: Built-In Self-Test with an Alternating Output. DATE 1998: 180-184

Egor S. Sogomonyan, Adit D. Singh, Michael Gössel: A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. VTS 1998: 324-331

Markus Seuring, Michael Gössel, Egor S. Sogomonyan: A Structural Approach for Space Compaction for Concurrent Checking and BIST. VTS 1998: 354-361

Hendrik Hartje, Michael Gössel, Egor S. Sogomonyan: Code-Disjoint Circuits for Parity Circuits. Asian Test Symposium 1997: 100-

Michael Gössel, Sebastian T. J. Fenn, David Taylor: On-line error detection for finite field multipliers. DFT 1997: 307-312

Andrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan: A linear code-preserving signature analyzer COPMISR. VTS 1997: 350-355

Michael Gössel, Egor S. Sogomonyan: A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST. J. Electronic Testing 8(2): 165-177 (1996)

Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick: Self-Checking Comparator with One Periodic Output. IEEE Trans. Computers 45(3): 379-380 (1996)

Egor S. Sogomonyan, Michael Gössel: Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. VTS 1996: 138-144

Vl. V. Saposhnikov, Alexej Dmitriev, Michael Gössel, V. V. Saposhnikov: Self-dual parity checking-A new method for on-line testing. VTS 1996: 162-168

T. Bogue, Helmut Jürgensen, Michael Gössel: BIST with negligible aliasing through random cover circuits. ASP-DAC 1995

T. Bogue, Helmut Jürgensen, Michael Gössel: Design of Cover Circuits for Monitoring the Output of a MISA. DFT 1994: 124-132

Stefan Gerber, Michael Gössel: Detection of Permanent Hardware Faults of a Floating Point Adder by Pseudoduplication. EDCC 1994: 327-335

Michael Gössel, Egor S. Sogomonyan: Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. VTS 1994: 151-157

Egor S. Sogomonyan, Michael Gössel: Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. J. Electronic Testing 4(3): 267-281 (1993)

Egor S. Sogomonyan, Michael Gössel: Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. DFT 1993: 239-246

Michael Gössel, Egor S. Sogomonyan: Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. VLSI 1993: 103-111

Michael Gössel: Optimal Error Detection Circuits for Sequential Circuits with Observable States. Fault-Tolerant Computing Systems 1991: 171-180

Michael Gössel, J. Saedler: Parallel computing of line-codings by use of a display processor system and the parallel determination of a discrete curvature. Recent Issues in Pattern Analysis and Recognition 1989: 29-41

Rolf-Jürgen Vilser, Reiner Creutzburg, Hans-Jörg Grundmann, Michael Gössel: Parallel matrix multiplication on an array-logical processor. Recent Issues in Pattern Analysis and Recognition 1989: 72-78

Wolfgang Luth, Michael Gössel: Linear image operations on the A6472 image processing system by use of the residue arithmetics. Recent Issues in Pattern Analysis and Recognition 1989: 162-168

Michael Gössel, Burghard Rebel: Parallel Access, to rectangles. Recent Issues in Pattern Analysis and Recognition 1989: 201-213

Wolfgang Luth, Rolf-Jürgen Vilser, Norbert Eichhorn, Michael Gössel: Bitgenaue schnelle Arithmethik mit dem Bildverarbeitunssystem BVS A 6472. Angewandte Informatik 30(3): 110-115 (1988)

Michael Gössel, V. V. Kaversnev, Burghard Rebel: Parallel memories for straight line and rectangle access. Parcella 1988: 89-109

Michael Gössel, R. Rebel: Memories for Parallel Subtree-Access. Parallel Algorithms and Architectures 1987: 122-130

Ferdinand Börner, Reinhard Pöschel, Michael Gössel: Sets of Permutations and Their Realization by Permutation Networks. Elektronische Informationsverarbeitung und Kybernetik 21(7/8): 331-342 (1985)

Michael Gössel: Bemerkung über die Existenz von Signaturregistern zur Erkennung geradzahliger Fehler. Elektronische Rechenanlagen 25(5): 233 (1983)

Michael Gössel, Reinhard Pöschel: Invariant Relations for Automata - A Proposal. Elektronische Informationsverarbeitung und Kybernetik 16(4): 147-169 (1980)

Michael Gössel, Heinz D. Modrow: Verallgemeinerte Superposition bei binären Automaten. Acta Cybern. 3: 163-171 (1977)

Michael Gössel, Reinhard Pöschel: On the Characterization of Linear and Linearizable Automata by a Superposition Principle. Mathematical Systems Theory 11: 61-76 (1977)

Michael Gössel: Über stabile Umkehrautomaten linearer Automaten. Elektronische Informationsverarbeitung und Kybernetik 9(1/2): 49-60 (1973)

Heinz D. Modrow, Michael Gössel: Zur Verarbeitung von Zufallsfolgen durch abstrakte Automaten I. Elektronische Informationsverarbeitung und Kybernetik 9(7/8): 433-454 (1973)

Heinz D. Modrow, Michael Gössel: Zur Verarbeitung von Zufallsfolgen durch abstrakte Automaten II. Elektronische Informationsverarbeitung und Kybernetik 9(9): 549-567 (1973)

K. Bellmann, Michael Gössel: Versuch einer automatentheoretischen Beschreibung von Selektionsprozess. Acta Cybern. 1: 93-96 (1972)

Michael Gössel, Hans-Volker Pürschel: Über Momente der Autokorrelationsfunktion eines Zeichens. Elektronische Informationsverarbeitung und Kybernetik 8(1): 49-53 (1972)

Michael Gössel, Heinz D. Modrow: Zur Realisierung stochastischer Automaten aus Zufallsgeneratoren und determinierten Automaten. Elektronische Informationsverarbeitung und Kybernetik 8(6/7): 325-333 (1972)

Michael Gössel: Über die Reduktion eines erweiterten linearen Automaten. Elektronische Informationsverarbeitung und Kybernetik 7(1): 49-52 (1971)

Michael Gössel: Zur minimalen Modellbildung bei linearen diskreten Systemen. Elektronische Informationsverarbeitung und Kybernetik 7(5/6): 355-369 (1971)

Michael Gössel: Abstandsmatrix eines Zeichens. Elektronische Informationsverarbeitung und Kybernetik 6(3): 145-153 (1970)

Michael Gössel: Ein Algorithmus für die Diagrammtechnik der Greenschen Funktion. Elektronische Informationsverarbeitung und Kybernetik 5(2): 127-137 (1969)