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 | 2007 | |
|---|---|---|
| j3 |      | R. Bottini, S. Costantini, N. Galbiati, A. Ghetti, G. Ghidini, A. Mauri, C. Scozzari, A. Sebastiani: High voltage transistor degradation in NVM pump application. Microelectronics Reliability 47(9-11): 1384-1388 (2007) |
| 2005 | ||
| j2 | | G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia: Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability 45(5-6): 857-860 (2005) |
| 2001 | ||
| j1 | | N. Galbiati, G. Ghidini, C. Cremonesi, L. Larcher: Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling. Microelectronics Reliability 41(7): 999-1002 (2001) |
| 1 | R. Bottini | |
| 2 | D. Brazzelli | |
| 3 | S. Costantini | |
| 4 | C. Cremonesi | |
| 5 | A. Garavaglia | |
| 6 | A. Ghetti | |
| 7 | G. Ghidini | |
| 8 | G. Giusto | |
| 9 | M. Langenbuch | |
| 10 | L. Larcher | |
| 11 | A. Mauri | |
| 12 | C. Scozzari | |
| 13 | A. Sebastiani |
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