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 | 2009 | |
|---|---|---|
| j3 |      | X. Garros, M. Casse, M. Rafik, Claire Fenouillet-Béranger, Gilles Reimbold, F. Martin, C. Wiemer, F. Boulanger: Process dependence of BTI reliability in advanced HK MG stacks. Microelectronics Reliability 49(9-11): 982-988 (2009) |
| 2007 | ||
| j2 | | Gilles Reimbold, J. Mitard, X. Garros, Charles Leroux, G. Ghibaudo, F. Martin: Initial and PBTI-induced traps and charges in Hf-based oxides/TiN stacks. Microelectronics Reliability 47(4-5): 489-496 (2007) |
| 2001 | ||
| j1 |  | N. Revil, X. Garros: Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications. Microelectronics Reliability 41(9-10): 1307-1312 (2001) |
| 1 | F. Boulanger | |
| 2 | M. Casse | |
| 3 | Claire Fenouillet-Béranger | |
| 4 | Gérard Ghibaudo (G. Ghibaudo) | |
| 5 | Charles Leroux | |
| 6 | F. Martin | |
| 7 | J. Mitard | |
| 8 | M. Rafik | |
| 9 | Gilles Reimbold | |
| 10 | N. Revil | |
| 11 | C. Wiemer |
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