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Anne E. Gattiker
Anne Gattiker
2010 – today
- 2013
[c27]Thomas H. Osiecki, Min-yu Tsai, Anne E. Gattiker, Damir A. Jamsek, Sani R. Nassif, William Evan Speight, Cliff C. N. Sze: Hardware Acceleration of an Efficient and Accurate Proton Therapy Monte Carlo. ICCS 2013: 2241-2250- [c26]James D. Warnock, Yuen H. Chan, Hubert Harrer, David L. Rude, Ruchir Puri, Sean M. Carey, Gerard Salem, Guenter Mayer, Yiu-Hing Chan, Mark D. Mayo, Adam Jatkowski, Gerald Strevig, Leon J. Sigal, Ayan Datta, Anne Gattiker, Aditya Bansal, Doug Malone, Thomas Strach, Huajun Wen, Pak-kin Mak, Chung-Lung Shum, Donald W. Plass, Charles F. Webb: 5.5GHz system z microprocessor and multi-chip module. ISSCC 2013: 46-47
- 2012
- [j8]Anne E. Gattiker, Phil Nigh: Guest Editors' Introduction: Yield Learning Processes and Methods. IEEE Design & Test of Computers 29(1): 6-7 (2012)
- [c25]Eun Jung Jang, Anne Gattiker, Sani R. Nassif, Jacob A. Abraham: An oscillation-based test structure for timing information extraction. VTS 2012: 74-79
- 2011
- [c24]Eun Jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham: Post-Silicon Timing Validation Method Using Path Delay Measurements. Asian Test Symposium 2011: 232-237
- [c23]
- [c22]Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham: Efficient and product-representative timing model validation. VTS 2011: 90-95
- [c21]Anne Gattiker: Invited paper: Yin and Yang of embedded sensors for post-scaling-era. VTS 2011: 324-327
- 2010
- [c20]Anne Gattiker: System-level impact of chip-level failure mechanisms and screens. ICCAD 2010: 173-176
2000 – 2009
- 2008
- [c19]
- [c18]
- 2007
- [j7]Anne Gattiker: Guest Editor's Introduction: Getting More Out of Test. IEEE Design & Test of Computers 24(5): 474-475 (2007)
- 2006
- [j6]
- [j5]Kerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer: High-performance CMOS variability in the 65-nm regime and beyond. IBM Journal of Research and Development 50(4-5): 433-450 (2006)
- [c17]Anne E. Gattiker: IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM. ISPD 2006: 47
- [c16]Anne Gattiker, Manjul Bhushan, Mark B. Ketchen: Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment. ITC 2006: 1-10
- [e1]Scott Davidson, Anne Gattiker (Eds.): 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. IEEE 2006, ISBN 1-4244-0292-1
- 2004
- [c15]
- [c14]Anne E. Gattiker: Diagnosis Meets Physical Failure Analysis: How Long can we Succeed? ITC 2004: 1441
- 2003
- [j4]James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker: Power supply transient signal analysis for defect-oriented test. IEEE Trans. on CAD of Integrated Circuits and Systems 22(3): 370-374 (2003)
- [c13]Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey: Deformations of IC Structure in Test and Yield Learning. ITC 2003: 856-865
- 2002
- [j3]Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly: Modeling the Economics of Testing: A DFT Perspective. IEEE Design & Test of Computers 19(1): 29-41 (2002)
- [c12]Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long: Static timing analysis based circuit-limited-yield estimation. ISCAS (5) 2002: 81-84
- [c11]Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu: Test structures for delay variability. Timing Issues in the Specification and Synthesis of Digital Systems 2002: 109
- [c10]Abhishek Singh, Jim Plusquellic, Anne E. Gattiker: Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models. VTS 2002: 357-366
- 2001
- [c9]Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long: Timing Yield Estimation from Static Timing Analysis. ISQED 2001: 437-442
- [c8]Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker: Detecting delay faults using power supply transient signal analysis. ITC 2001: 395-404
- 2000
- [c7]
1990 – 1999
- 1998
- [c6]
- 1997
- [j2]
- [c5]
- [c4]Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly: To DFT or Not to DFT? ITC 1997: 557-566
- [c3]
- 1996
- [c2]
- 1994
- [j1]Wojciech Maly, Derek Feltham, Anne E. Gattiker, Mark D. Hobaugh, Kenneth Backus, Michael E. Thomas: Smart-Substrate Multichip-Module Systems. IEEE Design & Test of Computers 11(2): 64-73 (1994)
- [c1]Anne E. Gattiker, Wojciech Maly: Feasibility Study of Smart Substrate Multichip Modules. ITC 1994: 41-49
Coauthor Index
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last updated on 2013-06-06 20:14 CEST by the dblp team