Daniel Geist

Daniel Geist, Oded Vaida: A method for hunting bugs that occur due to system conflicts. HLDVT 2008: 11-17

Daniel Geist, Mark Ginzburg, Yoad Lustig, Ishai Rabinovitz, Ohad Shacham, Rachel Tzoref: Supporting SAT based BMC on Finite Path Models. Electr. Notes Theor. Comput. Sci. 144(1): 67-77 (2006)

Baruch Schieber, Daniel Geist, Ayal Zaks: Computing the minimum DNF representation of Boolean functions defined by intervals. Discrete Applied Mathematics 149(1-3): 154-173 (2005)

Anat Dahan, Daniel Geist, Leonid Gluhovsky, Dmitry Pidan, Gil Shapir, Yaron Wolfsthal, Lyes Benalycherif, Romain Kamdem, Younes Lahbib: Combining System Level Modeling with Assertion Based Verification. ISQED 2005: 310-315

Shoham Ben-David, Cindy Eisner, Daniel Geist, Yaron Wolfsthal: Model Checking at IBM. Formal Methods in System Design 22(2): 101-108 (2003)

Julia Dushina, Mike Benjamin, Daniel Geist: Semi-formal test generation and resolving a temporal abstraction problem in practice: industrial application. ASP-DAC 2003: 699-704

Daniel Geist: The PSL/Sugar Specification Language A Language for all Seasons. CHARME 2003: 3

Daniel Geist, Enrico Tronci (Eds.): Correct Hardware Design and Verification Methods, 12th IFIP WG 10.5 Advanced Research Working Conference, CHARME 2003, L'Aquila, Italy, October 21-24, 2003, Proceedings. Lecture Notes in Computer Science 2860, Springer 2003, isbn 3-540-20363-X

Tamir Heyman, Daniel Geist, Orna Grumberg, Assaf Schuster: A Scalable Parallel Algorithm for Reachability Analysis of Very Large Circuits. Formal Methods in System Design 21(3): 317-338 (2002)

Sharon Barner, Daniel Geist, Anna Gringauze: Symbolic Localization Reduction with Reconstruction Layering and Backtracking. CAV 2002: 65-77

Yael Abarbanel-Vinov, Neta Aizenbud-Reshef, Ilan Beer, Cindy Eisner, Daniel Geist, Tamir Heyman, Iris Reuveni, Eran Rippel, Irit Shitsevalov, Yaron Wolfsthal, Tali Yatzkar-Haham: On the Effective Deployment of Functional Formal Verification. Formal Methods in System Design 19(1): 35-44 (2001)

Julia Dushina, Mike Benjamin, Daniel Geist: Semi-Formal Test Generation with Genevieve. DAC 2001: 617-622

Julia Dushina, Mike Benjamin, Daniel Geist: Semi-Formal Test Generation for a Block of Industrial DSP. VTS 2001: 131-137

Tamir Heyman, Daniel Geist, Orna Grumberg, Assaf Schuster: Achieving Scalability in Parallel Reachability Analysis of Very Large Circuits. CAV 2000: 20-35

Sagi Katz, Orna Grumberg, Daniel Geist: "Have I written enough Properties?" - A Method of Comparison between Specification and Implementation. CHARME 1999: 280-297

Daniel Geist, Giora Biran, Tamarah Arons, Michael Slavkin, Yvgeny Nustov, Monica Farkas, Karen Holtz, Andy Long, Dave King, Steve Barret: A Methodology for the Verification of a ``System on Chip''. DAC 1999: 574-579

Mike Benjamin, Daniel Geist, Alan Hartman, Gérard Mas, Ralph Smeets, Yaron Wolfsthal: A Study in Coverage-Driven Test Generation. DAC 1999: 970-975

Ilan Beer, Shoham Ben-David, Cindy Eisner, Daniel Geist, Leonid Gluhovsky, Tamir Heyman, Avner Landver, P. Paanah, Yoav Rodeh, G. Ronin, Yaron Wolfsthal: RuleBase: Model Checking at IBM. CAV 1997: 480-483

Daniel Geist, Monica Farkas, Avner Landver, Yossi Lichtenstein, Shmuel Ur, Yaron Wolfsthal: Coverage-Directed Test Generation Using Symbolic Techniques. FMCAD 1996: 143-158

Ashok K. Chandra, Vijay S. Iyengar, D. Jameson, R. V. Jawalekar, Indira Nair, Barry K. Rosen, Michael P. Mullen, J. Yoon, R. Armoni, Daniel Geist, Yaron Wolfsthal: AVPGEN-A test generator for architecture verification. IEEE Trans. VLSI Syst. 3(2): 188-200 (1995)

Ilan Beer, Shoham Ben-David, Daniel Geist, Raanan Gewirtzman, Michael Yoeli: Methodology and System for Practical Formal Verification of Reactive Hardware. CAV 1994: 182-193

Daniel Geist, Ilan Beer: Efficient Model Checking by Automated Ordering of Transition Relation Partitions. CAV 1994: 299-310

Daniel Geist, Ervin Y. Rodin: Adjacency of the 0-1 knapsack problem. Computers & OR 19(8): 797-800 (1992)

Daniel Geist, Michael W. Vannier: PC-based 3-D reconstruction of medical images. Computers & Graphics 13(2): 135-143 (1989)