- CSB - MetaPress - Google - Bing - Yahoo
 | 2007 | |
|---|---|---|
| j6 |      | R. Bottini, S. Costantini, N. Galbiati, A. Ghetti, G. Ghidini, A. Mauri, C. Scozzari, A. Sebastiani: High voltage transistor degradation in NVM pump application. Microelectronics Reliability 47(9-11): 1384-1388 (2007) |
| 2005 | ||
| j5 | | G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia: Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability 45(5-6): 857-860 (2005) |
| 2003 | ||
| j4 | | G. Ghidini, A. Garavaglia, G. Giusto, A. Ghetti, R. Bottini, D. Peschiaroli, M. Scaravaggi, F. Cazzaniga, D. Ielmini: Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET. Microelectronics Reliability 43(8): 1221-1227 (2003) |
| j3 | | A. Ghetti, D. Brazzelli, A. Benvenuti, G. Ghidini, A. Pavan: Anomalous gate oxide conduction on isolation edges: analysis and process optimization. Microelectronics Reliability 43(8): 1229-1235 (2003) |
| 2002 | ||
| j2 | | E. Viganò, A. Ghetti, G. Ghidini, Alessandro S. Spinelli: Post-breakdown characterization in thin gate oxides. Microelectronics Reliability 42(9-11): 1491-1496 (2002) |
| 2001 | ||
| j1 |  | A. Ghetti, M. Alam, J. Bude: Anode hole generation mechanisms. Microelectronics Reliability 41(9-10): 1347-1354 (2001) |
Colors in the list of coauthors
Last update Thu May 23 02:34:24 2013 CET by the DBLP Team —
Data released under the ODC-BY 1.0 license — See also our legal information page