Grady Giles

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	2010
c13		Mahmut Yilmaz, Baosheng Wang, Jayalakshmi Rajaraman, Tom Olsen, Kanwaldeep Sobti, Dwight Elvey, Jeff Fitzgerald, Grady Giles, Wei-Yu Chen: The scan-DFT features of AMD's next-generation microprocessor core. ITC 2010: 39-48
	2009
j2		Kedarnath J. Balakrishnan, Grady Giles, James Wingfield: Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor. IEEE Design & Test of Computers 26(1): 52-59 (2009)
c12		Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield: Test access mechanism for multiple identical cores. ITC 2009: 1-10
	2008
c11		Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield: Test Access Mechanism for Multiple Identical Cores. ITC 2008: 1-10
c10		Tim Wood, Grady Giles, Chris Kiszely, Martin Schuessler, Daniela Toneva, Joel Irby, Michael Mateja: The Test Features of the Quad-Core AMD Opteron- Microprocessor. ITC 2008: 1-10
	2005
c9		Grady Giles, Joel Irby, Daniela Toneva, Kun-Han Tsai: Built-in constraint resolution. ITC 2005: 10
	2002
c8		Grady Giles: Is Scan (Alone) Sufficient to Test Today?s Microprocessors? Not Quite, but We Can?t Get the Job Done Without It. ITC 2002: 1197
	2000
c7		Don E. Ross, Tim Wood, Grady Giles: Conversion of small functional test sets of nonscan blocks to scan patterns. ITC 2000: 691-700
	1998
j1		Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja: Test Development for Second-Generation ColdFire Microprocessors. IEEE Design & Test of Computers 15(3): 70-76 (1998)
	1997
c6		Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason: A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. ITC 1997: 424-432
	1992
c5		W. C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns: Implementing 1149.1 on CMOS Microprocessors. ITC 1992: 999-1006
	1991
c4		W. C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns: Implementing 1149.1 on CMOS Microprocessors. ITC 1991: 879-886
	1990
c3		Philip E. Bishop, Grady Giles, Sudarshan Iyengar, C. Thomas Glover, Wai-on Law: Testability considerations in the design of the MC68340 Integrated Processor Unit. ITC 1990: 337-346
	1986
c2		Grady Giles, Kenneth Scheuer: Testability Features of the MC68851 PMMU. ITC 1986: 408-411
	1985
c1		Grady Giles, Craig Hunter: A Methodology for Testing Content Addressable Memories. ITC 1985: 471-475

Coauthor Index

1	Dale Amason	[j1] [c6]
2	Kedarnath J. Balakrishnan	[j2] [c12] [c11]
3	Philip E. Bishop	[c3]
4	W. C. Bruce	[c5] [c4]
5	Wei-Yu Chen	[c13]
6	Alfred L. Crouch (Al Crouch)	[j1] [c6]
7	Renny Eisele	[j1] [c6]
8	Dwight Elvey	[c13]
9	Jeff Fitzgerald	[c13]
10	Michael G. Gallup	[c5] [c4]
11	C. Thomas Glover	[c3]
12	Craig Hunter	[c1]
13	Joel Irby	[c10] [c9]
14	Sudarshan Iyengar	[c3]
15	Chris Kiszely	[c10]
16	Wai-on Law	[c3]
17	Michael Mateja	[c10] [j1] [c6]
18	Tom Munns	[c5] [c4]
19	Tom Olsen	[c13]
20	Jayalakshmi Rajaraman	[c13]
21	Don E. Ross	[c7]
22	Kenneth Scheuer	[c2]
23	Martin Schuessler	[c10]
24	Anuja Sehgal	[c12] [c11]
25	Kanwaldeep Sobti	[c13]
26	Daniela Toneva	[c10] [c9]
27	Kun-Han Tsai	[c9]
28	Baosheng Wang	[c13]
29	Jing Wang	[c12] [c11]
30	James Wingfield	[j2] [c12] [c11]
31	Tim Wood	[c10] [c7]
32	Mahmut Yilmaz	[c13]

Colors in the list of coauthors

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