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 | 2011 | |
|---|---|---|
| j1 |      | Hyun Woo Choi, Alfred V. Gomes, Abhijit Chatterjee: Signal Acquisition of High-Speed Periodic Signals Using Incoherent Sub-Sampling and Back-End Signal Reconstruction Algorithms. IEEE Trans. VLSI Syst. 19(7): 1125-1135 (2011) |
| 2009 | ||
| c6 | | Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin: Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium 2009: 69-74 |
| 2001 | ||
| c5 | | Alfred V. Gomes, Abhijit Chatterjee: Distance Constrained Dimensionality Reduction for Parametric Fault Test Generator. Asian Test Symposium 2001: 411-416 |
| 1999 | ||
| c4 | | Alfred V. Gomes, Abhijit Chatterjee: Minimal Length Diagnostic Tests for Analog Circuits using Test History. DATE 1999: 189-194 |
| c3 | | Alfred V. Gomes, Abhijit Chatterjee: Robust optimization based backtrace method for analog circuits. ICCAD 1999: 304-308 |
| 1998 | ||
| c2 | | Alfred V. Gomes, Ramakrishna Voorakaranam, Abhijit Chatterjee: Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity. DFT 1998: 341-348 |
| 1997 | ||
| c1 | | Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao: Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. ITC 1997: 903-912 |
| 1 | Sudip Chakrabarti | |
| 2 | Abhijit Chatterjee | |
| 3 | Sasikumar Cherubal | |
| 4 | Hyun Woo Choi | |
| 5 | Shalabh Goyal | |
| 6 | Junwei Hou | |
| 7 | Le Jin | |
| 8 | William H. Kao | |
| 9 | Sehun Kook | |
| 10 | Vishwanath Natarajan | |
| 11 | Ramakrishna Voorakaranam |
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