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You can find the classic dblp view of this page here.
C. Grosjean
2000 – 2009
- 2007
[j3]J. Adrian, N. Rodriguez, F. Essely, G. Haller, C. Grosjean, A. Portavoce, C. Girardeaux: Investigation of a new method for dopant characterization. Microelectronics Reliability 47(9-11): 1599-1603 (2007)- 2006
[j2]N. Rodriguez, J. Adrian, C. Grosjean, G. Haller, C. Girardeaux, A. Portavoce: Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. Microelectronics Reliability 46(9-11): 1554-1557 (2006)- 2003
[j1]Paul-Henri Albarède, S. Lavagne, C. Grosjean: Strain investigation around shallow trench isolations : a LACBED Study. Microelectronics Reliability 43(9-11): 1693-1698 (2003)
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last updated on 2012-12-02 22:00 CET by the dblp team



