Michelangelo Grosso

Michelangelo Grosso, Hipólito Guzmán-Miranda, Miguel A. Aguirre: Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment. IEEE Trans. Industrial Informatics 9(1): 142-148 (2013)

Michelangelo Grosso, Wilson Javier Perez Holguin, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Paolo Tonda, J. Velasco Medina: Software-Based Testing for System Peripherals. J. Electronic Testing 28(2): 189-200 (2012)

Marta Portela-García, Michelangelo Grosso, M. Gallardo-Campos, Matteo Sonza Reorda, Luis Entrena, Mario García-Valderas, Celia López-Ongil: On the use of embedded debug features for permanent and transient fault resilience in microprocessors. Microprocessors and Microsystems - Embedded Hardware Design 36(5): 334-343 (2012)

Paolo Bernardi, Lyl M. Ciganda, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda: A SBST strategy to test microprocessors' Branch Target Buffer. DDECS 2012: 306-311

Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan: On-line software-based self-test of the Address Calculation Unit in RISC processors. European Test Symposium 2012: 1-6

Michelangelo Grosso, Wilson Javier Perez Holguin, Danilo Ravotto, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Paolo Tonda, Jaime Velasco-Medina: Functional Verification of DMA Controllers. J. Electronic Testing 27(4): 505-516 (2011)

Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Oscar Ballan: Fault grading of software-based self-test procedures for dependable automotive applications. DATE 2011: 513-514

Jorge Luis Lagos-Benites, Michelangelo Grosso, Matteo Sonza Reorda, G. Audisio, M. Pipponzi, Marco Sabatini, V. A. Avantaggiati: An FPGA-Emulation-Based Platform for Characterization of Digital Baseband Communication Systems. DFT 2011: 391-398

Jorge Luis Lagos-Benites, Michelangelo Grosso, Luca Sterpone, Matteo Sonza Reorda, G. Audisio, M. Pipponzi, Marco Sabatini: A Low-Cost Emulation System for Fast Co-verification and Debug. European Test Symposium 2011: 212

Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug. IET Computers & Digital Techniques 4(2): 104-113 (2010)

Paolo Bernardi, Leticia Maria Veiras Bolzani Poehls, Michelangelo Grosso, Matteo Sonza Reorda: A Hybrid Approach for Detection and Correction of Transient Faults in SoCs. IEEE Trans. Dependable Sec. Comput. 7(4): 439-445 (2010)

Michelangelo Grosso, Wilson J. H. Perez, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda, J. Velasco Medina: A software-based self-test methodology for system peripherals. European Test Symposium 2010: 195-200

Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda: An adaptive tester architecture for volume diagnosis. European Test Symposium 2010: 227-232

Paolo Rech, Michelangelo Grosso, Fabio Melchiori, D. Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda: Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. IOLTS 2010: 29-34

Michelangelo Grosso, Matteo Sonza Reorda, Marta Portela-García, Mario García-Valderas, Celia López-Ongil, Luis Entrena: An on-line fault detection technique based on embedded debug features. IOLTS 2010: 167-172

M. Di Marzio, Michelangelo Grosso, Matteo Sonza Reorda, Luca Sterpone, G. Audisio, Marco Sabatini: A novel scalable and reconfigurable emulation platform for embedded systems verification. ISCAS 2010: 865-868

Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Y. Zhang: A programmable BIST for DRAM testing and diagnosis. ITC 2010: 447-456

Oscar Ballan, Paolo Bernardi, Giovanni Fontana, Michelangelo Grosso, Ernesto Sánchez: A Fault Grading Methodology for Software-Based Self-Test Programs in Systems-on-Chip. MTV 2010: 43-46

Davide Appello, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda: Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs. IEEE Trans. VLSI Syst. 17(11): 1654-1659 (2009)

Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda: Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. European Test Symposium 2009: 93-98

Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello: Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS 2009: 69-74

Michelangelo Grosso, Matteo Sonza Reorda: Exploiting embedded FPGA in on-line software-based test strategies for microprocessor cores. IOLTS 2009: 95-100

Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda: DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS 2009: 276-281

Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso: An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. European Test Symposium 2008: 140-145

Paolo Bernardi, Kyriakos Christou, Michelangelo Grosso, Maria K. Michael, Ernesto Sánchez, Matteo Sonza Reorda: Exploiting MOEA to Automatically Geneate Test Programs for Path-Delay Faults in Microprocessors. EvoWorkshops 2008: 224-234

Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda: A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores. MTV 2008: 103-108

Kyriakos Christou, Maria K. Michael, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda: A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions. VTS 2008: 389-394

Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: A System-layer Infrastructure for SoC Diagnosis. J. Electronic Testing 23(5): 389-404 (2007)

Jorge Luis Lagos-Benites, Davide Appello, Paolo Bernardi, Michelangelo Grosso, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda: An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. DFT 2007: 291-300

Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: Safety Evaluation of NanoFabrics. DFT 2007: 418-426

Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda: On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores. European Test Symposium 2007: 179-184

Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda: Hardware-accelerated path-delay fault grading of functional test programs for processor-based systems. ACM Great Lakes Symposium on VLSI 2007: 411-416

Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda: System-in-Package Testing: Problems and Solutions. IEEE Design & Test of Computers 23(3): 203-211 (2006)

Paolo Bernardi, Michelangelo Grosso: Test Considerations about the Structured ASIC Paradigm. DDECS 2006: 232-233

Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: Embedded Memory Diagnosis: An Industrial Workflow. ITC 2006: 1-9

Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: On the Automation of the Test Flow of Complex SoCs. VTS 2006: 166-171

Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries. VTS 2006: 386-391

Alberto Manzone, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Ernesto Sánchez, Matteo Sonza Reorda: Integrating BIST Techniques for On-Line SoC Testing. IOLTS 2005: 235-240

Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores. MTV 2005: 55-62