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 | 2006 | |
|---|---|---|
| j2 |      | Y. C. Chou, D. Leung, R. Grundbacher, R. Lai, Q. Kan, P. H. Liu, D. Eng, T. Block, A. Oki: Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs. Microelectronics Reliability 46(1): 24-40 (2006) |
| 2004 | ||
| j1 | | Y. C. Chou, D. Leung, I. Smorchkova, M. Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng: Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. Microelectronics Reliability 44(7): 1033-1038 (2004) |
| 1 | T. Block | |
| 2 | L. Callejo | |
| 3 | Y. C. Chou | |
| 4 | D. Eng | |
| 5 | Q. Kan | |
| 6 | R. Lai | |
| 7 | D. Leung | |
| 8 | P. H. Liu | |
| 9 | A. Oki | |
| 10 | I. Smorchkova | |
| 11 | M. Wojtowicz |
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