Gerald Haller

R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, G. Haller, Vincent Pouget, Dean Lewis: Effects of 1064 nm laser on MOS capacitor. Microelectronics Reliability 52(9-10): 1816-1821 (2012)

R. Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, G. Haller, Vincent Pouget, Dean Lewis: Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. Microelectronics Reliability 51(9-11): 1658-1661 (2011)

Gerald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget: Net integrity checking by optical localization techniques. Microelectronics Reliability 49(9-11): 1175-1181 (2009)

Aziz Machouat, G. Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, F. Essely: Effect of physical defect on shmoos in CMOS DSM technologies. Microelectronics Reliability 48(8-9): 1333-1338 (2008)

Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gerald Haller, Vincent Goubier: Generic simulator for faulty IC. Microelectronics Reliability 48(8-9): 1592-1596 (2008)

J. Adrian, N. Rodriguez, F. Essely, G. Haller, C. Grosjean, A. Portavoce, C. Girardeaux: Investigation of a new method for dopant characterization. Microelectronics Reliability 47(9-11): 1599-1603 (2007)

N. Rodriguez, J. Adrian, C. Grosjean, G. Haller, C. Girardeaux, A. Portavoce: Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. Microelectronics Reliability 46(9-11): 1554-1557 (2006)

Abdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat: Impact of semiconductors material on IR Laser Stimulation signal. Microelectronics Reliability 45(9-11): 1465-1470 (2005)

Abdellatif Firiti, D. Faujour, Gerald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis: Short defect characterization based on TCR parameter extraction. Microelectronics Reliability 43(9-11): 1563-1568 (2003)

Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, Vincent Pouget, Dean Lewis: From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectronics Reliability 43(9-11): 1681-1686 (2003)

Felix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, Dean Lewis: Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability 42(9-11): 1729-1734 (2002)

O. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis: Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectronics Reliability 42(9-11): 1741-1746 (2002)