Yue Hao

Yunwei Sun, Thomas A. Buscheck, Yue Hao: An analytical method for modeling first-order decay networks. Computers & Geosciences 39: 86-97 (2012)

Jibin Fan, Hongxia Liu, Qianwei Kuang, Bo Gao, Fei Ma, Yue Hao: Physical properties and electrical characteristics of H₂O-based and O₃-based HfO₂ films deposited by ALD. Microelectronics Reliability 52(6): 1043-1049 (2012)

Hongxia Liu, Shulong Wang, Yue Hao: Modeling of enhancement factor of hole mobility for strained silicon under low stress intensity. Microelectronics Reliability 51(5): 909-913 (2011)

Jincheng Zhang, Zhiming Li, Yue Hao, Hao Wang, Peixian Li: Finite element analysis and optimization of temperature field in GaN-MOCVD reactor. SCIENCE CHINA Information Sciences 53(10): 2138-2143 (2010)

Hongxia Liu, Baojun Tang, Yue Hao: Characteristics analysis and optimization design of a new ESD power clamp circuit. Microelectronics Reliability 50(8): 1087-1093 (2010)

JinFeng Zhang, Yue Hao, Jincheng Zhang, JinYu Ni: The mobility of two-dimensional electron gas in AlGaN/GaN heterostructures with varied Al content. Science in China Series F: Information Sciences 51(6): 780-789 (2008)

Lin-An Yang, Chun-Li Yu, Yue Hao: A new model of subthreshold swing for sub-100 nm MOSFETs. Microelectronics Reliability 48(3): 342-347 (2008)

Ming-e Jing, Yue Hao, Dian Zhou, Xuan Zeng: A Novel Optimization Method for Parametric Yield: Uniform Design Mapping Distance Algorithm. IEEE Trans. on CAD of Integrated Circuits and Systems 26(6): 1149-1155 (2007)

Jueping Cai, Zan Li, Yue Hao, Jueting Cai: Time-variant Doppler frequency estimation and compensation for mobile OFDM systems. IEEE Trans. Consumer Electronics 52(2): 336-340 (2006)

Ming-e Jing, Yue Hao, JinFeng Zhang, Peijun Ma: Efficient parametric yield optimization of VLSI circuit by uniform design sampling method. Microelectronics Reliability 45(1): 155-162 (2005)

Junping Wang, Yue Hao: Short Critical Area Computational Method Using Mathematical Morphology. CIS (2) 2005: 796-803

Yue Hao, Jiming Liu, Yuping Wang, Yiu-ming Cheung, Hujun Yin, Licheng Jiao, Jianfeng Ma, Yong-Chang Jiao (Eds.): Computational Intelligence and Security, International Conference, CIS 2005, Xi'an, China, December 15-19, 2005, Proceedings, Part I. Lecture Notes in Computer Science 3801, Springer 2005, isbn 3-540-30818-0

Yue Hao, Jiming Liu, Yuping Wang, Yiu-ming Cheung, Hujun Yin, Licheng Jiao, Jianfeng Ma, Yong-Chang Jiao (Eds.): Computational Intelligence and Security, International Conference, CIS 2005, Xi'an, China, December 15-19, 2005, Proceedings, Part II. Lecture Notes in Computer Science 3802, Springer 2005, isbn 3-540-30819-9

Lei Xue, Yue Hao: Autonomy-subnet based structural synthesis and liveness guarantying policy of Petri net model of flexible manufacturing system. Science in China Series F: Information Sciences 47(3): 273-286 (2004)

Daoguang Liu, Siliu Xu, Kaicheng Li, Jin Zhang, Rongkan Liu, Yukui Liu, Zhengfan Zhang, Gangyi Hu, Yue Hao: Growth and quality control of MBE-based SiGe-HBT for amplifier applications. Microelectronics Journal 34(5-8): 587-589 (2003)

Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma: Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. DFT 2003: 11-17

Xiaohong Jiang, Yue Hao, Susumu Horiguchi: A new approach for critical area estimation in VLSI. Journal of Systems Architecture 47(10): 869-881 (2002)

Hongxia Liu, Yue Hao, Jiangang Zhu: A thorough investigation of hot-carrier-induced gate oxide breakdown in partially depleted N- and P-channel SIMOX MOSFETs. Microelectronics Reliability 42(7): 1037-1044 (2002)

Hongxia Ren, Yue Hao: Study on the degradation induced by donor interface state in deep-sub-micron grooved-gate P-channel MOSFET's. Microelectronics Reliability 41(4): 597-604 (2001)

Tianxu Zhao, Yue Hao, Peijun Ma, Taifeng Chen: Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model. DFT 2001: 48-

Xiaohong Jiang, Susumu Horiguchi, Yue Hao: Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core. DFT 2000: 30-

Tianxu Zhao, Yue Hao, Yong-Chang Jiao: VLSI Yield Optimization Based on the Sub-Processing-Element Level Redundancy. DFT 2000: 41-46