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Yujuan He
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'10
2010 – today
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2010
[j1]
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Jie Liu
,
Jicheng Zhou
,
Hongwei Luo
,
Xuedong Kong
,
Yunfei En
,
Qian Shi
,
Yujuan He
:
Total-dose-induced edge effect in SOI NMOS transistors with different layouts.
Microelectronics Reliability 50
(1): 45-47 (2010)
Coauthor Index
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What is the meaning of the colors in the coauthor index?
1
Yunfei En
[j1]
2
Xuedong Kong
[j1]
3
Jie Liu
[j1]
4
Hongwei Luo
[j1]
5
Qian Shi
[j1]
6
Jicheng Zhou
[j1]