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P. Heino
2010 – today
- 2010
[j5]Johanna Virkki, Tomi Seppälä, L. Frisk, P. Heino: Accelerated testing for failures of tantalum capacitors. Microelectronics Reliability 50(2): 217-219 (2010)
2000 – 2009
- 2003
- [j4]S. Myllymaki, Eero Ristolainen, P. Heino, A. Lehto, K. Varjonen: Evaluation Of Resonating Channel Transistor In SOI Wafer. International Journal of Computational Engineering Science 4(3): 711-714 (2003)
- [j3]P. Heino, Eero Ristolainen: Thermal conduction at the nanoscale in some metals by MD. Microelectronics Journal 34(9): 773-777 (2003)
- [j2]P. Heino, Eero Ristolainen: Strength of Ta-Si interfaces by molecular dynamics. Microelectronics Reliability 43(4): 645-650 (2003)
- 2002
- [j1]T. Alander, S. Nurmi, P. Heino, Eero Ristolainen: Impact of component placement in solder joint reliability. Microelectronics Reliability 42(3): 399-406 (2002)
1980 – 1989
- 1989
- [c2]P. Heino, Jouko Suokas, I. Karvonen: Design of Safe and Reliable Process Systems by Knowledge Based Safety Analysis. SCAI 1989: 415-429
- [c1]Jouko Suokas, P. Heino, Roar A. Fjellheim, R. Wennersten: Knowledge Based Risk Management System for Process Industry. SCAI 1989: 841-850
Coauthor Index
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last updated on 2013-01-17 17:53 CET by the dblp team