| 2010 | ||
|---|---|---|
| c15 | Tomasz Garbolino, Krzysztof Gucwa, Andrzej Hlawiczka: How to reduce size of a signature-based diagnostic dictionary used for testing of connections. DDECS 2010: 201-204 | |
| 2009 | ||
| c14 | Tomasz Rudnicki, Tomasz Garbolino, Krzysztof Gucwa, Andrzej Hlawiczka: Effective BIST for crosstalk faults in interconnects. DDECS 2009: 164-169 | |
| 2008 | ||
| c13 | Andrzej Hlawiczka, Krzysztof Gucwa, Tomasz Garbolino, Michal Kopec: Interconnect Faults Identification and Localization Using Modified Ring LFSRs. DDECS 2008: 247-250 | |
| 2007 | ||
| c12 | Tomasz Garbolino, Krzysztof Gucwa, Michal Kopec, Andrzej Hlawiczka: Avoiding Crosstalk Influence on Interconnect Delay Fault Testing. DDECS 2007: 149-152 | |
| c11 | ||
| 2006 | ||
| c10 | Tomasz Garbolino, Michal Kopec, Krzysztof Gucwa, Andrzej Hlawiczka: Detection, Localisation and Identification of Interconnection Faults Using MISR Compactor. DDECS 2006: 230-231 | |
| c9 | Michal Kopec, Tomasz Garbolino, Krzysztof Gucwa, Andrzej Hlawiczka: Test-per-Clock Detection, Localization and Identification of Interconnect Faults. European Test Symposium 2006: 233-238 | |
| 2004 | ||
| j5 | Ondrej Novák, Zdenek Plíva, Jiri Nosek, Andrzej Hlawiczka, Tomasz Garbolino, Krzysztof Gucwa: Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor. J. Electronic Testing 20(1): 109-122 (2004) | |
| 2002 | ||
| j4 | Tomasz Garbolino, Andrzej Hlawiczka: Efficient test pattern generators based on specific cellular automata structures. Microelectronics Reliability 42(6): 975-983 (2002) | |
| 2000 | ||
| c8 | Andrzej Hlawiczka, Michal Kopec: Design and testing of fast and cost effective serial seeding TPGs based on one-dimensional linear hybrid cellular automata. Asian Test Symposium 2000: 380-385 | |
| 1999 | ||
| c7 | Tomasz Garbolino, Andrzej Hlawiczka: A New LFSR with D and T Flip-Flops as an Effective Test Pattern Generator for VLSI Circuits. EDCC 1999: 321-338 | |
| 1997 | ||
| c6 | Dariusz Badura, Andrzej Hlawiczka: Low Cost Bist for Edac Circuits. Asian Test Symposium 1997: 410-415 | |
| c5 | Andrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan: A linear code-preserving signature analyzer COPMISR. VTS 1997: 350-355 | |
| 1996 | ||
| e1 | Andrzej Hlawiczka, João Gabriel Silva, Luca Simoncini (Eds.): Dependable Computing - EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 1996, Proceedings. Lecture Notes in Computer Science 1150, Springer 1996, isbn 3-540-61772-8 | |
| 1994 | ||
| c4 | Andrzej Hlawiczka, Jacek Binda: Optimized Synthesis of Self-Testable Finite State Machines (FSM) Using BIST-PST Structures in Altera Structures. FPL 1994: 120-122 | |
| 1992 | ||
| j3 | Andrzej Hlawiczka: Parallel Signature Analyzers Using Hybrid Design of Their Linear Feedbacks. IEEE Trans. Computers 41(12): 1562-1571 (1992) | |
| 1989 | ||
| c3 | Andrzej Hlawiczka: Signature Analysis Testing with Bottom-Top Exclusive Or Type MISR. Fehlertolerierende Rechensysteme 1989: 356-367 | |
| 1987 | ||
| c2 | Andrzej Hlawiczka, Dariusz Badura: Universal Test Controller Chip for Board Self Test. Fehlertolerierende Rechensysteme 1987: 165-175 | |
| 1986 | ||
| j2 | Andrzej Hlawiczka: Compression of Three-State Data Serial Streams by Means of a Parallel LFSR Signature Analyzer. IEEE Trans. Computers 35(8): 732-741 (1986) | |
| 1984 | ||
| c1 | Andrzej Hlawiczka: Compression of multiple-valued data serial streams by means of parallel LFSR signature analyzer. Fehlertolerierende Rechensysteme 1984: 404-416 | |
| 1978 | ||
| j1 | Andrzej Hlawiczka: Comments on `` Procedures for Eliminating Static and Dynamic-Hazards in Test Generation''. IEEE Trans. Computers 27(2): 191 (1978) | |
Colors in the list of coauthors
Last update Sat May 25 11:23:08 2013 CET by the DBLP Team —
Data released under the ODC-BY 1.0 license — See also our legal information page