Dale E. Hoffman

Dale E. Hoffman: Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. ITC 2002: 26

Robert M. Averill III, Keith G. Barkley, Michael A. Bowen, Peter J. Camporese, Allan H. Dansky, Robert F. Hatch, Dale E. Hoffman, Mark D. Mayo, Scott A. McCabe, Timothy G. McNamara, Thomas J. McPherson, Gregory A. Northrop, Leon J. Sigal, Howard H. Smith, David A. Webber, Patrick M. Williams: Chip integration methodology for the IBM S/390 G5 and G6 custom microprocessors. IBM Journal of Research and Development 43(5): 681-706 (1999)

Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins: Testing the 500-MHz IBM S/390 Microprocessor. IEEE Design & Test of Computers 15(3): 83-89 (1998)

Dale E. Hoffman, Robert M. Averill III, Brian W. Curran, Yuen H. Chan, Allan H. Dansky, Robert F. Hatch, Timothy G. McNamara, Thomas J. McPherson, Gregory A. Northrop, Leon J. Sigal, Anthony Pelella, Patrick M. Williams: Deep submicron design techniques for the 500 MHz IBM S/390 G5 custom microprocessor. ICCD 1998: 258-263

Kenneth L. Shepard, Sean M. Carey, Ee Kin Cho, Brian W. Curran, Robert F. Hatch, Dale E. Hoffman, Scott A. McCabe, Gregory A. Northrop, A. E. (Rick) Seigler: Design methodology for the S/390 Parallel Enterprise Server G4 microprocessors. IBM Journal of Research and Development 41(4&5): 515-548 (1997)

William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko, Stephen Pateras, Dale E. Hoffman, Timothy G. McNamara, Thomas J. Snethen: Advanced microprocessor test strategy and methodology. IBM Journal of Research and Development 41(4&5): 611-628 (1997)

Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko: Testing the 400-MHz IBM Generation-4 CMOS Chip. ITC 1997: 106-114