Tae-Eun Hong

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	2008
j1		Ulugbek Shaislamov, Jun-Mo Yang, Jung Ho Yoo, Hyun-Sang Seo, Kyung-Jin Park, Chel-Jong Choi, Tae-Eun Hong, Beelyong Yang: Two-dimensional dopant profiling in semiconductor devices by electron holography and chemical etching delineation techniques with the same specimen. Microelectronics Reliability 48(10): 1734-1736 (2008)

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