Takehiko Hoshino

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	2001
c1		Sei Takahashi, Munehisa Taira, Hidetaka Saegusa, Takehiko Hoshino, Hideo Nakamura: Development of a Fail-Safe Microprocessor LSI with Self-Diagnosis Mechanism Depending on an M-Sequence Code Signature. PRDC 2001: 191-198

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