Rick Hudgens

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	2012
j3		Mozar Naing, Dallas Webster, Nolan Blue, Rick Hudgens, Zahir Parkar, Sumeer Bhatara, Pankaj Gupta, Donald Y. C. Lie: Maximizing Parallel Testing in an FM Receiver. J. Electronic Testing 28(5): 723-731 (2012)
	2011
j2		Dallas Webster, Rick Hudgens, Donald Y. C. Lie: Replacing Error Vector Magnitude Test with RF and Analog BISTs. IEEE Design & Test of Computers 28(6): 66-75 (2011)
j1		Deepa Mannath, David Cohen, Victor Montaño-Martinez, Rick Hudgens, Elida de-Obaldia, Shai Kush, Simon S. Ang: Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTs. J. Electronic Testing 27(3): 253-266 (2011)

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