Urban Ingelsson

Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson: Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687. IEEE Design & Test of Computers 29(2): 79-88 (2012)

Breeta SenGupta, Urban Ingelsson, Erik Larsson: Scheduling Tests for 3D Stacked Chips under Power Constraints. J. Electronic Testing 28(1): 121-135 (2012)

Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson: Access Time Analysis for IEEE P1687. IEEE Trans. Computers 61(10): 1459-1472 (2012)

Q. Wang, Andreas Wallin, Viacheslav Izosimov, Urban Ingelsson, Zebo Peng: Test tool qualification through fault injection. European Test Symposium 2012: 1

Viacheslav Izosimov, Urban Ingelsson, Andreas Wallin: Requirement Decomposition and Testability in Development of Safety-Critical Automotive Components, . SAFECOMP 2012: 74-86

Breeta SenGupta, Urban Ingelsson, Erik Larsson: Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias. VLSI Design 2012: 442-447

Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson: Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints. Asian Test Symposium 2011: 525-531

Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson: Design automation for IEEE P1687. DATE 2011: 1412-1417

Urban Ingelsson, Shih-Yen Chang, Erik Larsson: Measurement point selection for in-operation wear-out monitoring. DDECS 2011: 381-386

Urban Ingelsson, Bashir M. Al-Hashimi: Investigation into voltage and process variation-aware manufacturing test. ITC 2011: 1-10

Mudassar Majeed, Daniel Ahlstrom, Urban Ingelsson, Gunnar Carlsson, Erik Larsson: Efficient Embedding of Deterministic Test Data. Asian Test Symposium 2010: 159-162

Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson: Test Time Analysis for IEEE P1687. Asian Test Symposium 2010: 455-460

Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson: Estimating Error-probability and its Application for Optimizing Roll-back Recovery with Checkpointing. DELTA 2010: 281-285

Urban Ingelsson, Bashir M. Al-Hashimi, S. Saqib Khursheed, Sudhakar M. Reddy, Peter Harrod: Process Variation-Aware Test for Resistive Bridges. IEEE Trans. on CAD of Integrated Circuits and Systems 28(8): 1269-1274 (2009)

S. Saqib Khursheed, Urban Ingelsson, Paul M. Rosinger, Bashir M. Al-Hashimi, Peter Harrod: Bridging Fault Test Method With Adaptive Power Management Awareness. IEEE Trans. on CAD of Integrated Circuits and Systems 27(6): 1117-1127 (2008)