Eugeni Isern

Joan Font-Rosselló, Eugeni Isern, Miquel Roca, Rodrigo Picos, Miquel Font-Rosselló, Eugeni García-Moreno: Band-Pass Filter Design with Diagnosis Facilities Based on Predictive Techniques. J. Electronic Testing 27(6): 685-696 (2011)

Kay Suenaga, Eugeni Isern, Rodrigo Picos, Sebastiàn A. Bota, Miquel Roca, Eugeni García-Moreno: Application of Predictive Oscillation-Based Test to a CMOS OpAmp. IEEE T. Instrumentation and Measurement 59(8): 2076-2082 (2010)

Eugeni García-Moreno, Kay Suenaga, Rodrigo Picos, Sebastiàn A. Bota, Miquel Roca, Eugeni Isern: Predictive test strategy for CMOS RF mixers. Integration 42(1): 95-102 (2009)

Luz Balado, Emili Lupon, Joan Figueras, Miquel Roca, Eugeni Isern, Rodrigo Picos: Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures. IEEE Trans. on Circuits and Systems 56-I(4): 754-762 (2009)

Kay Suenaga, Sebastiàn A. Bota, Rodrigo Picos, Eugeni Isern, Miquel Roca, Eugeni García-Moreno: Predictive Test Technique for Diagnosis of RF CMOS Receivers. VTS 2009: 129-133

Kay Suenaga, Rodrigo Picos, Sebastiàn A. Bota, Miquel Roca, Eugeni Isern, Eugenio García: A Module for BiST of CMOS RF Receivers. J. Electronic Testing 23(6): 605-612 (2007)

Rodrigo Picos, Miquel Roca, Eugeni Isern, Sebastiàn A. Bota, Eugenio García: On-line Monitoring Capabilities of Oscillation Test Techniques: Results Demonstration in an OTA. IOLTS 2004: 179

Joan Font, J. Ginard, Rodrigo Picos, Eugeni Isern, Jaume Segura, Miquel Roca, Eugenio García: A BICS for CMOS OpAmps by Monitoring the Supply Current Peak. J. Electronic Testing 19(5): 597-603 (2003)

Francesc Moll, Miquel Roca, Eugeni Isern: Analysis of dissipation energy of switching digital CMOS gates with coupled outputs. Microelectronics Journal 34(9): 833-842 (2003)

Joan Font, Rodrigo Picos, Miquel Roca, Eugeni Isern, Eugeni García-Moreno: A new BICS for CMOS operational amplifiers by using oscillation test techniques. Microelectronics Journal 34(10): 919-926 (2003)

Rodrigo Picos, Joan Font, Eugeni Isern, Miquel Roca, Eugenio García: A Configurable Built in Current Sensor for Mixed Signal Circuit Testing. IOLTS 2003: 167

Eugeni Isern, Miquel Roca, Francesc Moll: Analysis of the Contribution of Interconnect Effects in the Energy Dissipation of VLSI Circuits. PATMOS 2003: 481-490

Joan Font, J. Ginard, Eugeni Isern, Miquel Roca, Jaume Segura, Eugenio García: A BICS for CMOS Opamps by Monitoring the Supply Current Peak. IOLTW 2002: 94-98

Rodrigo Picos, Miquel Roca, Eugeni Isern, Jaume Segura, Eugeni García-Moreno: Experimental Results on BIC Sensors for Transient Current Testing. J. Electronic Testing 16(3): 235-241 (2000)

Eugeni Isern, Miquel Roca, Jaume Segura: Analyzing the Need for ATPG Targeting GOS Defects. VTS 1999: 420-425

Eugeni García-Moreno, Benjamín Iñíguez, Miquel Roca, Jaume Segura, Eugeni Isern: Clocked Dosimeter Compatible with Digital CMOS Technology. J. Electronic Testing 12(1-2): 101-110 (1998)

Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras: IDDQ testing: state of the art and future trends. Integration 26(1-2): 167-196 (1998)

Eugeni Isern, Joan Figueras: IDDQ Test and Diagnosis of CMOS Circuits. IEEE Design & Test of Computers 12(4): 60-67 (1995)

Eugeni Isern, Joan Figueras: Test of Bridging Faults in Scan-based Sequential Circuits. EDAC-ETC-EUROASIC 1994: 366-370

Eugeni Isern, Joan Figueras: Analysis of I_DDQ detectable bridges in combinational CMOS circuits. VTS 1994: 368-373

Eugeni Isern, Joan Figueras: Test Generation with High Coverages for Quiescent Current Test of Bridging Faults in Combinational Circuits. ITC 1993: 73-82