S. Jakschik

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	2007
j1		Rainer Duschl, M. Kerber, A. Avellan, S. Jakschik, U. Schroeder, S. Kudelka: Reliability aspects of Hf-based capacitors: Breakdown and trapping effects. Microelectronics Reliability 47(4-5): 497-500 (2007)

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