P. Y. Jasper

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	1994
j1		Inderpal S. Bhandari, Michael J. Halliday, Jarir K. Chaar, Ram Chillarege, K. Jones, J. S. Atkinson, C. Lepori-Costello, P. Y. Jasper, E. D. Tarver, C. C. Lewis, M. Yonezawa: In-Process Improvement through Defect Data Interpretation. IBM Systems Journal 33(1): 182-214 (1994)

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