 | 2013 |
| j8 |  | |
| 2005 |
| j7 |  | Giancarlo Marullo-Reedtz, Roberto Cerri, Wolfgang Waldmann, Jiri Streit, Pekka Immonen, Isabelle Blanc, Felix Raso, Torsten Funck, Bernd Schumacher, Erik F. Dierikx, Mario Nunes, Peter Vrabcek, Dusan Rudohradsky, Ove Gunnarsson, Karl-Erik Rydler, Blaise Jeanneret, Beat Jeckelmann, Thomas Pulfer, Saliha Selcik Turhan, Okan Yilmaz, Jonathan M. Williams, Harald Slinde, Kare Lind, Jacques Nicolas, Matjaz Lindic, Eirini Flouda, Gábor Erdös: Comparison EUROMET.EM-K8 of DC voltage ratio: results. IEEE T. Instrumentation and Measurement 54(2): 576-579 (2005) |
| 2003 |
| j6 |  | Jürgen Melcher, Jürgen Schurr, Klaus Pierz, Jonathan M. Williams, Stephen P. Giblin, F. Cabiati, Luca Callegaro, Giancarlo Marullo-Reedtz, Cristina Cassiago, Beat Jeckelmann, Blaise Jeanneret, Frédéric Overney, Jaroslav Bohacek, J. Riha, O. Power, J. Murray, Mario Nunes, M. Lobo, I. Godinho: The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect. IEEE T. Instrumentation and Measurement 52(2): 563-568 (2003) |
| j5 |  | |
| j4 |  | |
| 2001 |
| j3 |  | |
| j2 |  | Bernd Schumacher, Peter Warnecke, W. Poirier, I. Delgado, Z. Msimang, Giorgio Boella, Per-Otto Hetland, Randolph E. Elmquist, Jonathan M. Williams, David Inglis, Beat Jeckelmann, Ove Gunnarsson, Alexandre Satrapinsky: Transport behavior of commercially available 100-Ω standard resistors. IEEE T. Instrumentation and Measurement 50(2): 242-244 (2001) |
| j1 |  | |