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 | 2008 | |
|---|---|---|
| j1 |      | Jin-Young Kim, Jung-Ho Seo, Hyun-Woo Lim, Chang-Hyun Ban, Kyu-Chae Kim, Jin-Goo Park, Sung-Chae Jeon, Bong-Hoe Kim, Seung-Oh Jin, Young Hu: Effect of a Guard-Ring on the Leakage Current in a Si-PIN X-Ray Detector for a Single Photon Counting Sensor. IEICE Transactions 91-C(5): 703-707 (2008) |
| 1 | Chang-Hyun Ban | |
| 2 | Young Hu | |
| 3 | Sung-Chae Jeon | |
| 4 | Bong-Hoe Kim | |
| 5 | Jin-Young Kim | |
| 6 | Kyu-Chae Kim | |
| 7 | Hyun-Woo Lim | |
| 8 | Jin-Goo Park | |
| 9 | Jung-Ho Seo |
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