Frans de Jong Coauthor index pubzone.org

F. G. M. de Jong

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c13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans de Jong: Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. European Test Symposium 2008: 27-32
2007
c12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Alex S. Biewenga, Frans de Jong: SiP-test: Predicting delivery quality. ITC 2007: 1-10
2006
c11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Frans de Jong, Alex S. Biewenga: SiP-TAP: JTAG for SiP. ITC 2006: 1-10
2003
c10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Wouter Rijckaert, Frans de Jong: Board Test Coverage: The Value of Prediction and How to Compare Numbers. ITC 2003: 1277
c9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Frans de Jong, Leon van de Logt: IEEE P1581: To Live or Let die? ITC 2003: 1278
2002
c8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Rodger Schuttert, Frans de Jong, Ben Kup: Improved Test Monitor Circuit in Power Pin DfT. VTS 2002: 345-350
2001
c7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
F. G. M. de Jong, Alex S. Biewenga, D. C. L. van Geest, T. F. Waayers: Testing and programming flash memories on assemblies during high volume production. ITC 2001: 470-479
2000
c6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Frans de Jong, Ben Kup, Rodger Schuttert: Power pin testing: making the test coverage complete. ITC 2000: 575-584
1999
c5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Alex S. Biewenga, Henk D. L. Hollmann, Frans de Jong, Maurice Lousberg: Static component interconnect test technology (SCITT) a new technology for assembly testing. ITC 1999: 439-448
c4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Frans de Jong: SCITT: Back to Basics in Mass Production Testing. ITC 1999: 1138
1992
c3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Frans de Jong, Adriaan J. de Lind van Wijngaarden: Memory Interconnection Test at Board Level. ITC 1992: 328-337
1991
c2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Frans de Jong, Frank van der Heyden: Testing the Integrity of the Boundary Scan Test Infrastructure. ITC 1991: 106-112
1990
c1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Frans de Jong: Boundary scan test used at board level: moving towards reality. ITC 1990: 235-242

Coauthor Index

1Alex S. Biewenga
[c12] [c11] [c7] [c5]
2D. C. L. van Geest
[c7]
3Guido Gronthoud
[c13]
4Frank van der Heyden
[c13] [c2]
5Henk D. L. Hollmann
[c5]
6Ben Kup
[c8] [c6]
7Leon van de Logt
[c9]
8Maurice Lousberg
[c5]
9Wouter Rijckaert
[c10]
10Rodger Schuttert
[c8] [c6]
11T. F. Waayers
[c7]
12Adriaan J. de Lind van Wijngaarden
[c3]
13Vladimir A. Zivkovic
[c13]
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